受老化、周围环境和伽马辐射影响的印刷石墨烯电气特性研究

IF 2.5 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Device and Materials Reliability Pub Date : 2023-12-28 DOI:10.1109/TDMR.2023.3344019
Kevin Goodman;Roberto S. Aga;Rachel Aga;Robert Cooper;Lei R. Cao;Emily Heckman
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引用次数: 0

摘要

由于印刷电子技术比传统制造方法更具优势,因此可印刷电子技术的进步使该技术得以在实验室中广泛应用。要在宇宙环境中使用印刷电子技术,最终用户有必要了解电离辐射对这些材料的影响,因为电离辐射对微电子的威胁可能相当严重,甚至会导致失效。本文包含将气溶胶喷射印刷石墨烯暴露于伽马辐射的结果,并研究了这些影响与老化的结合,以了解印刷石墨烯是否适合太空环境。文章记录了辐射对印刷石墨烯电气性能的影响,并展示了老化和暴露于环境中对这些影响的作用。对大多数空穴载流子浓度的随附数据显示,电离辐射使石墨烯的载流子浓度增加了 3.57%,迁移率增加了 4.5%,功函数增加了 2.21%。虽然这些数值很明显,但老化本身却使功函数增加了 1.66%,电阻增加了 22.9%。虽然观察到的电阻变化很大,但对石墨烯进行平和处理后,电阻变化仅为 5%。这表明,在采用所讨论的方法时,石墨烯墨水对高达 1 Mrad(Si)的伽马射线辐照具有很强的抵抗力。研究结果表明,这种气溶胶喷射打印石墨烯导电墨水的方法对伽马辐射具有很强的抵抗力,即使在太空等伽马辐射普遍存在的环境中使用,这种方法也能替代传统的平版印刷技术。
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Investigation on Electrical Properties of Printed Graphene Subjected to Aging, Ambient Environment and Gamma Radiation
Advancements in printable electronics technology allow the technique to populate laboratories on a widespread scale due to advantages printing electronics holds over customary fabrication methods. For utilization of printed electronics in cosmic environments it behooves end-users to understand the effects of ionizing radiation on these materials as such a threat to microelectronics can be quite detrimental even to the point of failure. This article contains results from exposing aerosol-jet printed graphene to gamma radiation and examines these effects when combined with aging to understand if printed graphene is a suitable candidate for space environments. It documents the effects of radiation on electrical properties of the printed graphene, and it demonstrates the roles of aging and exposure to ambient environment on these effects. Accompanying data taken of the majority hole carrier concentration show an increase of 3.57%, mobility 4.5%, and work function 2.21% from ionizing radiation. While these values are noticeable, aging alone increased the work function by 1.66%, and resistance by 22.9%. While the change observed in resistance is substantial, pacifying the graphene resulted in only a 5% change in resistance. This indicates the graphene ink proves resilient to gamma irradiation up to 1 Mrad(Si) when the discussed methods are implored. The findings indicate this method of aerosol-jet printing graphene based conductive inks demonstrates robustness against gamma radiation making the method a plausible alternative to traditional lithographic techniques even when utilized in environments where gamma radiation is prevalent such as space.
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来源期刊
IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability 工程技术-工程:电子与电气
CiteScore
4.80
自引率
5.00%
发文量
71
审稿时长
6-12 weeks
期刊介绍: The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.
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