硬 X 射线范围内的散射极性测量法

Q3 Physics and Astronomy Instruments Pub Date : 2024-03-02 DOI:10.3390/instruments8010020
E. Costa
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引用次数: 0

摘要

在一年半的时间里,成像 X 射线偏振探测仪证明了偏振探测在 X 射线天文学中的作用和潜力。下一步工作包括向更高能量扩展。光电方法有可能扩展到 20-25 千伏,但超过这一能量的唯一技术是康普顿散射。掠入射光学技术可以将光子聚焦到 80 千伏,不排除将其边缘扩展到 150-200 千伏。考虑到所涉及的物理限制,从光电方法到散射方法的转变可能会因为高背景而降低光学技术的使用效果。我将讨论探测器设计方面的选择,以缓解这一问题,并为未来的技术发展提供指导。
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Scattering Polarimetry in the Hard X-ray Range
In one and a half years, the Imaging X-ray Polarimetry Explorer has demonstrated the role and the potentiality of Polarimetry in X-ray Astronomy. The next steps include extension to higher energies. There is margin for an extension of the photoelectric approach up to 20–25 keV, but above that energy the only technique is Compton Scattering. Grazing incidence optics can focus photons up to 80 keV, not excluding a marginal extension to 150–200 keV. Given the physical constraints involved, the passage from photoelectric to scattering approach can make less effective the use of optics because of the high background. I discuss the choices in terms of detector design to mitigate the problem and the guidelines for future technological developments.
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来源期刊
Instruments
Instruments Physics and Astronomy-Instrumentation
CiteScore
2.60
自引率
0.00%
发文量
70
审稿时长
11 weeks
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