Identification of synthetic wheat lines with broadly effective stripe rust resistance

Wheat stripe/yellow rust (WYR), caused by Puccinia striiformis f. sp. tritici (Pst), is a major constraint in global wheat production. A set of 766 hexaploid synthetic wheat lines, including primary crosses of Triticum turgidum x Aegilops tauschii and their derivatives, were screened in artificially rust inoculated field nurseries for three seasons. From this set, a core set of 94 non-lodging lines with unique pedigrees and resistance to Pst that was consistent across years was established. The core set was tested for adult plant field response under field conditions for three seasons in Australia and at least one crop season in Ethiopia, India, Kenya, Nepal and Pakistan. It was also challenged with an array of well-defined Pst pathotypes at seedling growth stages in the greenhouse, and genotyped with molecular markers linked to the adult plant resistance (APR) genes Yr18, Yr36 and Yr46. Combined analysis of field rust responses, multi-pathotype seedling phenotyping and marker genotyping resolved seven classes of Pst resistance: uncatalogued (new) APR (UAPR, 11%), uncatalogued seedling resistance (USR, 46%), known seedling resistance (KSR, 5%), KSR + USR (2%), Yr18 + UAPR (4%), Yr18 + USR (29%) and Yr18 + KSR (3%). A majority of the lines carrying UAPR and USR either singly or in combination showed high levels of field resistance across all field sites and years of testing, demonstrating that these lines represent a valuable resource for breeding wheat for resistance to Pst.