Zichun Li;Yibo Liu;Feng Feng;Zhaoyong Liu;Man Wong;Hoi Sing Kwok;Zhaojun Liu
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引用次数: 0
摘要
与传统显示技术相比,微型 LED 具有许多优势,是一种前景广阔的第四代显示技术。然而,微型 LED 的大规模生产仍然面临挑战,尤其是在生产高质量的红色微型 LED 方面。低效率红色微型 LED 是需要克服的一大挑战。在本文中,我们将重点介绍在提高基于 InGaN 的红色微型 LED 器件性能方面的最新进展。我们总结了近年来各研究小组在外延和工艺层面提高红色微型 LED 效率和性能的各种方法。这些方法包括使用 InGaNOS 衬底、增加 V 形凹坑密度和其他方法来提高晶体质量、加入纳米结构以提高光提取效率,以及优化制造工艺以减少缺陷和提高均匀性。这些方法大大提高了红色微型 LED 的效率和性能。尽管做出了这些努力,但开发高效可靠的红色微型 LED 仍是一项严峻的挑战。要解决红色微型 LED 性能限制背后的基本材料和器件物理问题,还需要进一步的研究。
Micro-LEDs have emerged as a promising fourth generation display technology with many advantages over traditional displays. However, the mass production of micro-LEDs still faces challenges, particularly in the production of high-quality red micro-LEDs. Low efficiency red micro-LEDs are a major challenge that needs to be overcome. In this paper, we focus on recent advancements in improving the device performance of InGaN-based red micro-LEDs. We summarize the various approaches taken by research groups in recent years to improve the efficiency and performance of red micro-LEDs at both the epitaxial and process levels. These include the use of InGaNOS substrates, increasing the density of V-shaped pits and other methods to improve crystal quality, the incorporation of nanostructures to enhance light extraction efficiency, and the optimization of fabrication processes to reduce defects and improve uniformity. These approaches have resulted in significant improvements in the efficiency and performance of red micro-LEDs. Despite these efforts, the development of efficient and reliable red micro-LEDs remains a critical challenge. Further research is needed to address the fundamental material and device physics underlying the performance limitations of red micro-LEDs.