S. ISMAIL, Y. BCHIRI, I. HALIDOU, N. BOUGUILA, M. KRAINI, N. YACOUBI, CARLOS VÁZQUEZ VÁZQUEZ, S. ALAYA
{"title":"β-In2S3 薄膜的光电偏转分析:S/In 莫拉比率的影响","authors":"S. ISMAIL, Y. BCHIRI, I. HALIDOU, N. BOUGUILA, M. KRAINI, N. YACOUBI, CARLOS VÁZQUEZ VÁZQUEZ, S. ALAYA","doi":"10.1142/s0218625x24500860","DOIUrl":null,"url":null,"abstract":"<p><span><math altimg=\"eq-00004.gif\" display=\"inline\" overflow=\"scroll\"><mi>β</mi></math></span><span></span>-In<sub>2</sub>S<sub>3</sub> thin films (<span><math altimg=\"eq-00005.gif\" display=\"inline\" overflow=\"scroll\"><mstyle><mtext mathvariant=\"normal\">S/In</mtext></mstyle><mo>=</mo><mn>1</mn></math></span><span></span>, 2 and 4) were prepared using the pneumatic spray pyrolysis (PSP) route to analyze the effect of the S/In ratio on the physical properties. These properties were conducted using the photothermal deflection spectroscopy (PDS) method. The PDS signal amplitudes as a function of wavelength show multiple reflections which appear for all prepared In<sub>2</sub>S<sub>3</sub> films. Such multiple reflections indicate homogeneity and high crystalline quality of the films. The deduced values of the optical band gap vary in the range 2.55–2.65<span><math altimg=\"eq-00006.gif\" display=\"inline\" overflow=\"scroll\"><mspace width=\".17em\"></mspace></math></span><span></span>eV. The highest thermal diffusivity is obtained for <span><math altimg=\"eq-00007.gif\" display=\"inline\" overflow=\"scroll\"><mstyle><mtext mathvariant=\"normal\">S/In</mtext></mstyle><mo>=</mo><mn>2</mn></math></span><span></span>. The product (<span><math altimg=\"eq-00008.gif\" display=\"inline\" overflow=\"scroll\"><mi>μ</mi><mo>⋅</mo><mi>τ</mi></math></span><span></span>) is found in order of 10<span><math altimg=\"eq-00009.gif\" display=\"inline\" overflow=\"scroll\"><msup><mrow></mrow><mrow><mo>−</mo><mn>8</mn></mrow></msup></math></span><span></span><span><math altimg=\"eq-00010.gif\" display=\"inline\" overflow=\"scroll\"><mspace width=\".17em\"></mspace></math></span><span></span>cm<span><math altimg=\"eq-00011.gif\" display=\"inline\" overflow=\"scroll\"><msup><mrow></mrow><mrow><mo>−</mo><mn>1</mn></mrow></msup></math></span><span></span>/V. The estimated carrier diffusion lengths are 0.06, 0.11 and 0.09<span><math altimg=\"eq-00012.gif\" display=\"inline\" overflow=\"scroll\"><mspace width=\".17em\"></mspace></math></span><span></span><span><math altimg=\"eq-00013.gif\" display=\"inline\" overflow=\"scroll\"><mi>μ</mi></math></span><span></span>m for films corresponding to <span><math altimg=\"eq-00014.gif\" display=\"inline\" overflow=\"scroll\"><mstyle><mtext mathvariant=\"normal\">S/In</mtext></mstyle><mo>=</mo><mn>1</mn></math></span><span></span>, 2 and 4, respectively. Defect absorption in <span><math altimg=\"eq-00015.gif\" display=\"inline\" overflow=\"scroll\"><mi>β</mi></math></span><span></span>-In<sub>2</sub>S<sub>3</sub> films is also investigated by PDS. Five absorption peaks are observed. These absorption peaks contain defect information in the band gap. Hence, this work evidences that <span><math altimg=\"eq-00016.gif\" display=\"inline\" overflow=\"scroll\"><mi>β</mi></math></span><span></span>-In<sub>2</sub>S<sub>3</sub> is a multi-functional material that can be used in optoelectronic, photovoltaic and visible-irradiation photocatalyst applications.</p>","PeriodicalId":22011,"journal":{"name":"Surface Review and Letters","volume":"126 1","pages":""},"PeriodicalIF":1.2000,"publicationDate":"2024-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"PHOTOTHERMAL DEFLECTION ANALYSIS OF β-In2S3 THIN FILMS: THE EFFECT OF S/In MOLAR RATIOS\",\"authors\":\"S. ISMAIL, Y. BCHIRI, I. HALIDOU, N. BOUGUILA, M. KRAINI, N. YACOUBI, CARLOS VÁZQUEZ VÁZQUEZ, S. ALAYA\",\"doi\":\"10.1142/s0218625x24500860\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><span><math altimg=\\\"eq-00004.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mi>β</mi></math></span><span></span>-In<sub>2</sub>S<sub>3</sub> thin films (<span><math altimg=\\\"eq-00005.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mstyle><mtext mathvariant=\\\"normal\\\">S/In</mtext></mstyle><mo>=</mo><mn>1</mn></math></span><span></span>, 2 and 4) were prepared using the pneumatic spray pyrolysis (PSP) route to analyze the effect of the S/In ratio on the physical properties. These properties were conducted using the photothermal deflection spectroscopy (PDS) method. The PDS signal amplitudes as a function of wavelength show multiple reflections which appear for all prepared In<sub>2</sub>S<sub>3</sub> films. Such multiple reflections indicate homogeneity and high crystalline quality of the films. The deduced values of the optical band gap vary in the range 2.55–2.65<span><math altimg=\\\"eq-00006.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mspace width=\\\".17em\\\"></mspace></math></span><span></span>eV. The highest thermal diffusivity is obtained for <span><math altimg=\\\"eq-00007.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mstyle><mtext mathvariant=\\\"normal\\\">S/In</mtext></mstyle><mo>=</mo><mn>2</mn></math></span><span></span>. The product (<span><math altimg=\\\"eq-00008.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mi>μ</mi><mo>⋅</mo><mi>τ</mi></math></span><span></span>) is found in order of 10<span><math altimg=\\\"eq-00009.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><msup><mrow></mrow><mrow><mo>−</mo><mn>8</mn></mrow></msup></math></span><span></span><span><math altimg=\\\"eq-00010.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mspace width=\\\".17em\\\"></mspace></math></span><span></span>cm<span><math altimg=\\\"eq-00011.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><msup><mrow></mrow><mrow><mo>−</mo><mn>1</mn></mrow></msup></math></span><span></span>/V. The estimated carrier diffusion lengths are 0.06, 0.11 and 0.09<span><math altimg=\\\"eq-00012.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mspace width=\\\".17em\\\"></mspace></math></span><span></span><span><math altimg=\\\"eq-00013.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mi>μ</mi></math></span><span></span>m for films corresponding to <span><math altimg=\\\"eq-00014.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mstyle><mtext mathvariant=\\\"normal\\\">S/In</mtext></mstyle><mo>=</mo><mn>1</mn></math></span><span></span>, 2 and 4, respectively. Defect absorption in <span><math altimg=\\\"eq-00015.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mi>β</mi></math></span><span></span>-In<sub>2</sub>S<sub>3</sub> films is also investigated by PDS. Five absorption peaks are observed. These absorption peaks contain defect information in the band gap. Hence, this work evidences that <span><math altimg=\\\"eq-00016.gif\\\" display=\\\"inline\\\" overflow=\\\"scroll\\\"><mi>β</mi></math></span><span></span>-In<sub>2</sub>S<sub>3</sub> is a multi-functional material that can be used in optoelectronic, photovoltaic and visible-irradiation photocatalyst applications.</p>\",\"PeriodicalId\":22011,\"journal\":{\"name\":\"Surface Review and Letters\",\"volume\":\"126 1\",\"pages\":\"\"},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2024-02-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Surface Review and Letters\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1142/s0218625x24500860\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface Review and Letters","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1142/s0218625x24500860","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
PHOTOTHERMAL DEFLECTION ANALYSIS OF β-In2S3 THIN FILMS: THE EFFECT OF S/In MOLAR RATIOS
-In2S3 thin films (, 2 and 4) were prepared using the pneumatic spray pyrolysis (PSP) route to analyze the effect of the S/In ratio on the physical properties. These properties were conducted using the photothermal deflection spectroscopy (PDS) method. The PDS signal amplitudes as a function of wavelength show multiple reflections which appear for all prepared In2S3 films. Such multiple reflections indicate homogeneity and high crystalline quality of the films. The deduced values of the optical band gap vary in the range 2.55–2.65eV. The highest thermal diffusivity is obtained for . The product () is found in order of 10cm/V. The estimated carrier diffusion lengths are 0.06, 0.11 and 0.09m for films corresponding to , 2 and 4, respectively. Defect absorption in -In2S3 films is also investigated by PDS. Five absorption peaks are observed. These absorption peaks contain defect information in the band gap. Hence, this work evidences that -In2S3 is a multi-functional material that can be used in optoelectronic, photovoltaic and visible-irradiation photocatalyst applications.
期刊介绍:
This international journal is devoted to the elucidation of properties and processes that occur at the boundaries of materials. The scope of the journal covers a broad range of topics in experimental and theoretical studies of surfaces and interfaces. Both the physical and chemical properties are covered. The journal also places emphasis on emerging areas of cross-disciplinary research where new phenomena occur due to the presence of a surface or an interface. Representative areas include surface and interface structures; their electronic, magnetic and optical properties; dynamics and energetics; chemical reactions at surfaces; phase transitions, reconstruction, roughening and melting; defects, nucleation and growth; and new surface and interface characterization techniques.