知识图谱完备性测量技术分类

IF 1.9 3区 计算机科学 Q3 AUTOMATION & CONTROL SYSTEMS Journal of Systems Engineering and Electronics Pub Date : 2023-12-06 DOI:10.23919/jsee.2023.000150
Ying Zhang, Gang Xiao
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引用次数: 0

摘要

目前,知识图谱虽然已经广泛应用于推荐系统、问答系统、智能搜索等多个领域,但始终存在知识遗漏、知识错误等质量问题。质量评估与控制作为保证知识质量的重要手段,通过对知识图谱进行合理评估,同时修正和改进质量问题,可以使基于知识图谱的应用更加完善、更加准确。因此,作为知识图谱构建过程中不可或缺的一部分,质量评估与控制的结果决定了知识图谱的实用性。其中,完整性的评估与提升作为评估与控制阶段的重要环节,决定了知识图谱能否全面反映客观现象,揭示实体间的潜在联系。本文回顾了完备性评估的具体技术,并从封闭世界假设、开放世界假设和部分完备性假设三个方面对完备性评估技术进行了分类。本文旨在通过对完备性评估技术的回顾和分类,进一步推动知识图谱质量控制的发展,并为知识图谱完备性评估的后续研究奠定基础。
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Classification of Knowledge Graph Completeness Measurement Techniques
At present, although knowledge graphs have been widely used in various fields such as recommendation systems, question and answer systems, and intelligent search, there are always quality problems such as knowledge omissions and errors. Quality assessment and control, as an important means to ensure the quality of knowledge, can make the applications based on knowledge graphs more complete and more accurate by reasonably assessing the knowledge graphs and fixing and improving the quality problems at the same time. Therefore, as an indispensable part of the knowledge graph construction process, the results of quality assessment and control determine the usefulness of the knowledge graph. Among them, the assessment and enhancement of completeness, as an important part of the assessment and control phase, determine whether the knowledge graph can fully reflect objective phenomena and reveal potential connections among entities. In this paper, we review specific techniques of completeness assessment and classify completeness assessment techniques in terms of closed world assumptions, open world assumptions, and partial completeness assumptions. The purpose of this paper is to further promote the development of knowledge graph quality control and to lay the foundation for subsequent research on the completeness assessment of knowledge graphs by reviewing and classifying completeness assessment techniques.
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来源期刊
Journal of Systems Engineering and Electronics
Journal of Systems Engineering and Electronics 工程技术-工程:电子与电气
CiteScore
4.10
自引率
14.30%
发文量
131
审稿时长
7.5 months
期刊介绍: Information not localized
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