{"title":"P 图驱动的稳健 PFMEA 开发","authors":"Yavuz Goktas, Yunwei Hu, D. Yellamati","doi":"10.1109/RAMS51492.2024.10457592","DOIUrl":null,"url":null,"abstract":"In this paper, we introduce a systematic approach for developing Process Failure Mode Effects Analysis (PFMEA) by incorporating p-diagrams. P-diagrams have proven to be successful in the development of Design Failure Mode Effects Analysis (DFMEA). PFMEA is a crucial tool for minimizing process risks, and we believe that leveraging p-diagrams can greatly enhance its effectiveness. There is a noticeable gap in the literature regarding the application of p-diagrams in PFMEA development. To address this gap, our proposed approach aims to provide a comprehensive guide for developing p-diagram driven robust PFMEA development. By utilizing p-diagrams, we aim to improve the accuracy and robustness of the PFMEA process. We start by analyzing the process through the creation of a process flow diagram. This diagram provides a visual representation of the interconnected steps involved in the process. Following that, we develop p-diagrams for each focus item (any potentially critical step or cell in the manufacturing process) we have identified as a potential risk using Change Point Analysis or any other risk assessment methodology. These p-diagrams help us gain a better understanding of the relationships between manufacturing parameters, manufacturing failure modes, noise factors or potential causes(6M), and required functions of the focus area. This understanding is essential for a structured transition into Process Failure Mode and Effects Analysis (PFMEA). To further enhance our analysis, we leverage the 6M (Ishikawa) approach as a proactive input into p-diagram as potential causes that drive any potential manufacturing failure modes. This categorizes potential sources of noise factors into six main categories (Man, Machine, Materials, Methods, Measurement, Mother Nature), allowing us to identify and address various noise factors that may impact the process requirements. Subsequently, the PFMEA team proceeds to complete the remaining columns, such as failure consequences, and evaluates the Risk Priority Numbers (RPNs). This systematic process thoroughly examines all functions and potential noise factors that could lead to deviations from ideal functionality. By doing so, it enhances efficiency and reduces the likelihood of overlooking important causes of failures.","PeriodicalId":518362,"journal":{"name":"2024 Annual Reliability and Maintainability Symposium (RAMS)","volume":"103 2","pages":"1-7"},"PeriodicalIF":0.0000,"publicationDate":"2024-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"P-Diagram Driven Robust PFMEA Development\",\"authors\":\"Yavuz Goktas, Yunwei Hu, D. Yellamati\",\"doi\":\"10.1109/RAMS51492.2024.10457592\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we introduce a systematic approach for developing Process Failure Mode Effects Analysis (PFMEA) by incorporating p-diagrams. P-diagrams have proven to be successful in the development of Design Failure Mode Effects Analysis (DFMEA). PFMEA is a crucial tool for minimizing process risks, and we believe that leveraging p-diagrams can greatly enhance its effectiveness. There is a noticeable gap in the literature regarding the application of p-diagrams in PFMEA development. To address this gap, our proposed approach aims to provide a comprehensive guide for developing p-diagram driven robust PFMEA development. By utilizing p-diagrams, we aim to improve the accuracy and robustness of the PFMEA process. We start by analyzing the process through the creation of a process flow diagram. This diagram provides a visual representation of the interconnected steps involved in the process. Following that, we develop p-diagrams for each focus item (any potentially critical step or cell in the manufacturing process) we have identified as a potential risk using Change Point Analysis or any other risk assessment methodology. These p-diagrams help us gain a better understanding of the relationships between manufacturing parameters, manufacturing failure modes, noise factors or potential causes(6M), and required functions of the focus area. This understanding is essential for a structured transition into Process Failure Mode and Effects Analysis (PFMEA). To further enhance our analysis, we leverage the 6M (Ishikawa) approach as a proactive input into p-diagram as potential causes that drive any potential manufacturing failure modes. This categorizes potential sources of noise factors into six main categories (Man, Machine, Materials, Methods, Measurement, Mother Nature), allowing us to identify and address various noise factors that may impact the process requirements. Subsequently, the PFMEA team proceeds to complete the remaining columns, such as failure consequences, and evaluates the Risk Priority Numbers (RPNs). This systematic process thoroughly examines all functions and potential noise factors that could lead to deviations from ideal functionality. By doing so, it enhances efficiency and reduces the likelihood of overlooking important causes of failures.\",\"PeriodicalId\":518362,\"journal\":{\"name\":\"2024 Annual Reliability and Maintainability Symposium (RAMS)\",\"volume\":\"103 2\",\"pages\":\"1-7\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-01-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2024 Annual Reliability and Maintainability Symposium (RAMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS51492.2024.10457592\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2024 Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS51492.2024.10457592","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
在本文中,我们介绍了一种结合 P 型图开发过程失效模式影响分析 (PFMEA) 的系统方法。事实证明,P 型图在开发设计失效模式影响分析 (DFMEA) 过程中非常成功。PFMEA 是最大限度降低流程风险的重要工具,我们相信利用 P 型图可以大大提高其有效性。关于在 PFMEA 开发中应用 p 型图的文献存在明显的空白。为了弥补这一空白,我们提出的方法旨在为开发 p 型图驱动的稳健 PFMEA 开发提供全面指导。通过利用 p 型图,我们旨在提高 PFMEA 流程的准确性和稳健性。我们首先通过创建流程图来分析流程。流程图直观地展示了流程中相互关联的步骤。然后,我们为每个重点项目(生产流程中任何潜在的关键步骤或单元)绘制 p 型图,这些重点项目是我们利用变化点分析法或任何其他风险评估方法确定的潜在风险。这些 p 型图有助于我们更好地理解制造参数、制造故障模式、噪声因素或潜在原因 (6M) 以及重点领域所需功能之间的关系。这种理解对于有条不紊地过渡到过程失效模式和影响分析 (PFMEA) 至关重要。为了进一步加强分析,我们利用 6M(石川)方法,将其作为驱动任何潜在制造故障模式的潜在原因,主动输入到 P 图中。这将潜在的噪声源因素分为六大类(人、机器、材料、方法、测量、自然),使我们能够识别并解决可能影响工艺要求的各种噪声因素。随后,PFMEA 团队继续完成其余栏目,如故障后果,并评估风险优先级编号 (RPN)。这一系统化流程彻底检查了所有功能和可能导致偏离理想功能的潜在噪声因素。这样做不仅能提高效率,还能降低忽略重要故障原因的可能性。
In this paper, we introduce a systematic approach for developing Process Failure Mode Effects Analysis (PFMEA) by incorporating p-diagrams. P-diagrams have proven to be successful in the development of Design Failure Mode Effects Analysis (DFMEA). PFMEA is a crucial tool for minimizing process risks, and we believe that leveraging p-diagrams can greatly enhance its effectiveness. There is a noticeable gap in the literature regarding the application of p-diagrams in PFMEA development. To address this gap, our proposed approach aims to provide a comprehensive guide for developing p-diagram driven robust PFMEA development. By utilizing p-diagrams, we aim to improve the accuracy and robustness of the PFMEA process. We start by analyzing the process through the creation of a process flow diagram. This diagram provides a visual representation of the interconnected steps involved in the process. Following that, we develop p-diagrams for each focus item (any potentially critical step or cell in the manufacturing process) we have identified as a potential risk using Change Point Analysis or any other risk assessment methodology. These p-diagrams help us gain a better understanding of the relationships between manufacturing parameters, manufacturing failure modes, noise factors or potential causes(6M), and required functions of the focus area. This understanding is essential for a structured transition into Process Failure Mode and Effects Analysis (PFMEA). To further enhance our analysis, we leverage the 6M (Ishikawa) approach as a proactive input into p-diagram as potential causes that drive any potential manufacturing failure modes. This categorizes potential sources of noise factors into six main categories (Man, Machine, Materials, Methods, Measurement, Mother Nature), allowing us to identify and address various noise factors that may impact the process requirements. Subsequently, the PFMEA team proceeds to complete the remaining columns, such as failure consequences, and evaluates the Risk Priority Numbers (RPNs). This systematic process thoroughly examines all functions and potential noise factors that could lead to deviations from ideal functionality. By doing so, it enhances efficiency and reduces the likelihood of overlooking important causes of failures.