利用 E-FISHG 方法进行电场分布三维测量的适当激光聚焦和信号采集条件

Masataka Sogame, Shin Nakamura, Masahiro Sato, Takashi Fujii, Akiko Kumada
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摘要

利用电场诱导二次谐波发生(E-FISHG)测量电场因其非侵入性和高时空分辨率而备受关注。在使用 E-FISHG 方法测量电场时,焦斑外沿激光路径的外加电场剖面会影响 SHG 信号。我们提出了一种从沿激光路径的 SHG 分布校准和推断外加电场剖面的方法。在之前的研究中,我们成功地从一系列 SHG 信号中推断出了相对简单的电场轮廓。为了测量更复杂的电场剖面,我们将我们的方法应用于三种情况的电场剖面:(1) 具有不同尖锐度的剖面;(2) 具有两个峰值的剖面;(3) SHG 信号上叠加噪声的剖面。通过适当选择共焦参数,可以推断出应用电场分布,误差不超过 10%。我们还为已知外加电场近似形状时所需的信号采集区域和测量间距提供了指导,这对实际测量非常重要。
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Adequate laser focusing and signal acquisition conditions for 3D measurement of electric-field distribution by the E-FISHG method
Electric field measurement using electric-field-induced second-harmonic generation (E-FISHG) has attracted attention because of its non-invasiveness and high spatiotemporal resolution. In the electric field measurement by the E-FISHG method, the applied electric-field profile along the laser path outside the focal spot affects the SHG signal. We have proposed a method of calibrating and inferring the applied electric-field profile from the SHG distribution along the laser path. In our previous research, the successful inference of a relatively simple electric-field profile from a series of SHG signals was demonstrated. To measure more complex electric-field profiles, we apply our method to three cases of electric-field profiles: (1) the profile with different sharpness, (2) the profile with two peaks, and (3) the profile with noise superimposed on the SHG signal. The applied electric-field distribution can be inferred within 10% error by adequately choosing the confocal parameter. We also provide guidelines for the required signal acquisition region and measurement pitch when the approximate shape of the applied electric field is known, which are important for actual measurement.
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