lpGBT 生产和鉴定测试概述

D. Hernandez Montesinos, S. Baron, S. Biereigel, P. Hazell, S. Kulis, P. Vicente Leitao, P. Moreira, D. Porret, K. Wyllie
{"title":"lpGBT 生产和鉴定测试概述","authors":"D. Hernandez Montesinos, S. Baron, S. Biereigel, P. Hazell, S. Kulis, P. Vicente Leitao, P. Moreira, D. Porret, K. Wyllie","doi":"10.1088/1748-0221/19/04/c04048","DOIUrl":null,"url":null,"abstract":"\n The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC used in high-energy physics experiments for multipurpose high-speed bidirectional serial links. Around 200,000 chips have been tested with a production test system capable of exercising the majority of the ASIC functionality to ensure its correct operation.\nFurthermore, specific individual qualification tests were carried out beyond the production tester limits, including radiation, multi-drop bus topology, inter-chip communication through different types of electrical links and characterization of jitter and stability of the recovered clocks.\nIn this article, an overview of the production and qualification tests is given together with their results demonstrating the robustness and flexibility of the lpGBT.","PeriodicalId":507814,"journal":{"name":"Journal of Instrumentation","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Overview of the production and qualification tests of the lpGBT\",\"authors\":\"D. Hernandez Montesinos, S. Baron, S. Biereigel, P. Hazell, S. Kulis, P. Vicente Leitao, P. Moreira, D. Porret, K. Wyllie\",\"doi\":\"10.1088/1748-0221/19/04/c04048\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC used in high-energy physics experiments for multipurpose high-speed bidirectional serial links. Around 200,000 chips have been tested with a production test system capable of exercising the majority of the ASIC functionality to ensure its correct operation.\\nFurthermore, specific individual qualification tests were carried out beyond the production tester limits, including radiation, multi-drop bus topology, inter-chip communication through different types of electrical links and characterization of jitter and stability of the recovered clocks.\\nIn this article, an overview of the production and qualification tests is given together with their results demonstrating the robustness and flexibility of the lpGBT.\",\"PeriodicalId\":507814,\"journal\":{\"name\":\"Journal of Instrumentation\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Instrumentation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/1748-0221/19/04/c04048\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1748-0221/19/04/c04048","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

低功耗千兆位收发器(lpGBT)是一种耐辐射 ASIC,用于高能物理实验的多用途高速双向串行链路。此外,还进行了超出生产测试仪限制的特定单项鉴定测试,包括辐射、多点总线拓扑、通过不同类型电气链路的芯片间通信以及恢复时钟的抖动和稳定性鉴定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Overview of the production and qualification tests of the lpGBT
The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC used in high-energy physics experiments for multipurpose high-speed bidirectional serial links. Around 200,000 chips have been tested with a production test system capable of exercising the majority of the ASIC functionality to ensure its correct operation. Furthermore, specific individual qualification tests were carried out beyond the production tester limits, including radiation, multi-drop bus topology, inter-chip communication through different types of electrical links and characterization of jitter and stability of the recovered clocks. In this article, an overview of the production and qualification tests is given together with their results demonstrating the robustness and flexibility of the lpGBT.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Identification of material by X-ray fluorescence analysis with a pyroelectric X-ray generator Quasi-continuous re-binning of measured spectra and associated uncertainties Implementation of energy reduced 90Sr/90Y radiation fields, or: Propagation of beta radiation, a case study Evaluation of the activation of the radiation shielding of the LaDiff neutron triple-axis-spectrometer at FRM-II by simulation/calculation Calculation of efficiency and resolution of a hexagonal NaI(Tl) detector as a function of source position
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1