磁场对透射电子显微镜下电子束诱导的金微粒库仑爆炸的影响

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2024-04-22 DOI:10.1016/j.ultramic.2024.113978
Wen Feng , Thomas Gemming , Lars Giebeler , Jiang Qu , Kristina Weinel , Leonardo Agudo Jácome , Bernd Büchner , Ignacio Gonzalez-Martinez
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引用次数: 0

摘要

在这项工作中,我们在透射电子显微镜内用逐渐会聚的电子束照射支撑在无定形碳薄膜上的金微粒,使其碎裂。这种现象被通称为 "电子束诱导碎裂 "或 EBIF,其物理起源仍存在争议。一方面,EBIF 主要被描述为电子束诱导加热的结果。另一方面,EBIF 被认为是束流诱导充电最终导致库仑爆炸的结果。为了测试 EBIF 充电框架的可行性,我们在两种不同的实验条件下对金粒子进行了碎裂试验。首先,显微镜的磁性物镜满负荷工作,即背景磁场 B=2 T,然后关闭磁性物镜(洛伦兹模式),即 B=0T。这有力地表明,磁场效应在诱发微颗粒上的 EBIF 方面起着至关重要的作用。临界电流密度值与环境磁场存在与否的关系无法用光束诱导加热模型来解释。因此,这项研究提出了强有力的实验证据,表明静电荷驱动的库仑爆炸是 EBIF 的根本原因。
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Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy

In this work we instigated the fragmentation of Au microparticles supported on a thin amorphous carbon film by irradiating them with a gradually convergent electron beam inside the Transmission Electron Microscope. This phenomenon has been generically labeled as “electron beam-induced fragmentation” or EBIF and its physical origin remains contested. On the one hand, EBIF has been primarily characterized as a consequence of beam-induced heating. On the other, EBIF has been attributed to beam-induced charging eventually leading to Coulomb explosion. To test the feasibility of the charging framework for EBIF, we instigated the fragmentation of Au particles under two different experimental conditions. First, with the magnetic objective lens of the microscope operating at full capacity, i.e. background magnetic field B=2 T, and with the magnetic objective lens switched off (Lorenz mode), i.e. B=0 T. We observe that the presence or absence of the magnetic field noticeably affects the critical current density at which EBIF occurs. This strongly suggests that magnetic field effects play a crucial role in instigating EBIF on the microparticles. The dependence of the value of the critical current density on the absence or presence of an ambient magnetic field cannot be accounted for by the beam-induced heating model. Consequently, this work presents robust experimental evidence suggesting that Coulomb explosion driven by electrostatic charging is the root cause of EBIF.

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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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