二维单元素 (X-enes) 扶手纳米带肖特基势垒场效应晶体管的性能比较

IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Nanotechnology Pub Date : 2024-03-01 DOI:10.1109/TNANO.2024.3395986
Rajesh C. Junghare;Ganesh C. Patil
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引用次数: 0

摘要

在这项研究中,我们对采用沿扶手椅方向宽度为 10 个二聚体的二维单元素(X-烯)纳米带(NR)作为沟道材料的肖特基势垒(SB)场效应晶体管(FET)进行了全面分析。用于模拟氢钝化 X-ene NR SBFET 的多尺度方法包括密度泛函理论 (DFT)、基于万尼尔函数的紧密结合和非平衡格林函数形式主义 (NEGF)。推导出的石墨烯、锗烯、磷烯和硅烯等 X 烯的带隙分别为 1.27、0.379、1.036 和 0.431 eV。为了考虑金属-X-烯界面的带弯曲效应,还提出了对传统多尺度方法进行修改的建议。为了模拟金属-X-烯界面的带弯曲效应,模型中提出的方案包括在哈密顿矩阵中添加等效通道势能,以及在初始电荷曲线中添加固定电荷。此外,还探讨了 SB 宽度、费米级钉扎和散射对器件性能的影响。结果表明,石墨烯和磷烯 SBFET 的通态驱动电流与断态漏电流比高达 ∼107 量级,而硅烯和锗烯 SBFET 的通态驱动电流与断态漏电流比为 ∼103 量级。
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Performance Comparison of 2D Mono-Elemental (X-enes) Armchair Nanoribbon Schottky Barrier Field Effect Transistors
In this work, comprehensive analysis of Schottky barrier (SB) field effect transistors (FETs) having 2D mono-elemental (X-enes) nanoribbon (NR) with width of 10 dimers along the armchair direction as a channel material has been carried out. The multi-scale approach used for simulating the hydrogen passivated X-ene NR SBFETs consists of density functional theory (DFT), Wannier function based tight binding and the non-equilibrium Green's Function formalism (NEGF). The derived bandgaps for X-enes such as graphene, germanene, phosphorene and silicene are 1.27, 0.379, 1.036 and 0.431 eV respectively. To incorporate the effect of band-bending at the metal-X-ene interface the modification in the conventional multi-scale approach has also been proposed. To mimic the effect of band bending at metal-X-ene interface the schemes proposed in the model are, addition of equivalent channel potential energy in the Hamiltonian matrix and the addition of fixed charges in initial charge profile. Further, the impact of SB width, Fermi level pinning and the scattering on the device performance has also been explored. The results show that the on-state drive current-to-off-state leakage current ratio in the case of graphene and phosphorene SBFETs is up-to the order ∼10 7 whereas for silicene and germanene SBFETs it is in the order of ∼10 3 .
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来源期刊
IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.30%
发文量
74
审稿时长
8.3 months
期刊介绍: The IEEE Transactions on Nanotechnology is devoted to the publication of manuscripts of archival value in the general area of nanotechnology, which is rapidly emerging as one of the fastest growing and most promising new technological developments for the next generation and beyond.
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