作为储氢材料的四氧杂[8]环烯单层:密度泛函理论中的 Boys-Bernardi 校正模型

E. V. Anikina, D. V. Babailova, M. S. Zhilin, V. P. Beskachko
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引用次数: 0

摘要

摘要 利用密度泛函理论和弥散相互作用校正(半经验和解析)研究了分子氢在四氧杂[8]环烯单层上的吸附参数。计算采用了两种不同的系统波函数表示方法:类原子轨道基集和平面波基。利用计算成本较低的伪原子基,如果对类原子基进行优化,并根据氢结合能和几何特征修正基集叠加误差,就有可能获得与平面波计算值一致的分子氢吸附结果。否则,氢结合能将被高估 4-6 倍(有时甚至高估 20 倍);氢单层距离将被低估 10-20%。得到的伪原子基集优化参数可用于进一步研究四氧杂[8]环烯单层的修饰形式。此外,我们的计算还表明,氢与原始四氧杂[8]环烯单层的结合主要是范德华结合,其能量为 60-90 meV,比理想的 200-600 meV 范围小几倍。要达到这样的数值,就必须对单层表面进行改性,例如,通过金属装饰或结构缺陷等方法,创造出更活跃的吸附引物。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Tetraoxa[8]circulene Monolayer as Hydrogen Storage Material: Model with Boys–Bernardi Corrections Within Density Functional Theory

Abstract

The parameters of molecular hydrogen adsorption on a tetraoxa[8]circulene monolayer were studied using the density functional theory with dispersion interaction corrections (semi-empirical and analytical). The calculations were carried out using two different approaches to the system wave function representation: atomic-like orbital basis set and plane wave basis. Utilizing a less computationally expensive pseudo-atomic basis, it is possible to obtain results for molecular hydrogen adsorption consistent with values calculated with plane waves if the atomic-like basis is optimized and basis set superposition error is corrected for both hydrogen binding energy and geometrical characteristics. Otherwise, the H2 binding energy will be overestimated by 4–6 times (sometimes even more, by 20); and the hydrogen–monolayer distance will be underestimated by 10–20%. The obtained optimized parameters of the pseudo-atomic basis set can be used for further study of the modified forms of the tetraoxa[8]circulene monolayer. Moreover, our calculations showed that the hydrogen binding to a pristine tetraoxa[8]circulene monolayer is predominantly van der Waals with an energy of 60–90 meV, which is several times less than the desired range of 200–600 meV. To achieve such values, it will be necessary to modify the surface of the monolayer, creating more active sorption cites, for example, by decorating it with metals or applying structural defects.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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