分形热力学模型中 Nd100 - xFex 合金表面的分形特性

S. A. Mikheev, E. M. Semenova, Yu. G. Pastushenkov, V. P. Tsvetkov, I. V. Tsvetkov
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引用次数: 0

摘要

摘要 在分形热力学模型的框架内,研究了 Nd100 - xFex 合金表面在广泛的浓度 х(х = 20-90)范围内的分形特性。为此,我们对感应熔炼合成的一系列 Nd100 - xFex 合金的表面进行了扫描电子显微镜图像分析。结果表明,所有研究样品在蚀刻前后的表面结构都高度接近分形。表征所研究样品与分形相对偏差的参数 δ 值范围在 0.017-0.029 之间。绘制了分形参数 Sf、Tf、Ef 和 x 的三维图,以及相同参数 Sf、Tf、Ef 和 x 的二维图,反映了蚀刻前后 Nd100 - xFex 合金样品表面状态的性质。计算了所有研究合金样品的分形状态方程参数值。在 x = 20 时,Nd100 - xFex 合金的矫顽力最大值 Hc = 4.8 kE 与分形熵 Sf = 39.86、分形温度 Tf = 529 和分形维度 D = 2.6530 的值之间建立了相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Fractal Properties of the Nd100 – xFex Alloys Surface in the Fractal Thermodynamics Model

Abstract

The study of the fractal properties of the surface of Nd100 – xFex alloys in a wide range of concentrations х (х = 20–90) was carried out in the framework of the fractal thermodynamics model. To this end, we performed an analysis of scanning electron microscopy images of the surfaces of a series of Nd100 – xFex alloys synthesized by induction melting. A high degree of proximity of the surface structure of all the studied samples, both before and after etching, to fractals is shown. The values of the parameter δ characterizing the relative deviation of the studied samples from the fractal are in the range of 0.017–0.029. Three-dimensional diagrams of the fractal parameters Sf, Tf, Ef, and x and two-dimensional diagrams of the same parameters Sf, Tf, Ef, and x reflecting the nature of the state of the surfaces of Nd100 – xFex alloy samples before and after etching are constructed. For all investigated alloy samples, the values of the parameters of the fractal equations of state are calculated. The correlation of the maximum value of the coercive force Hc = 4.8 kE with the values of fractal entropy Sf = 39.86, fractal temperature Tf = 529, and fractal dimension D = 2.6530 of the Nd100 – xFex alloys at x = 20 has been established.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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