Amod Kumar, Aliva Panigrahi, Mukesh Shekhar, Lawrence Kumar, Pawan Kumar
{"title":"掺杂 Eu 和 Mn 对铋铁氧体随温度变化的介电弛豫行为和导电机制的影响","authors":"Amod Kumar, Aliva Panigrahi, Mukesh Shekhar, Lawrence Kumar, Pawan Kumar","doi":"10.1007/s10832-024-00346-0","DOIUrl":null,"url":null,"abstract":"<p>The temperature dependent microscopic conduction processes and dielectric relaxations in Eu and Mn co-doped multiferroic bismuth ferrite have been examined using complex frequency-dependent ac conductivity, electric modulus and complex impedance examinations. The modified Debye’s function was used to explore the dispersion behaviour of the dielectric constant. The correlated barrier hopping concept is supported by the frequency variation in ac conductivity at various temperatures, which follows Jonscher’s power law. It was observed that when the co-doping concentration is low, the thermally assisted correlated barrier hopping (CBH) conduction model is better suited for the present samples whereas the overlapping large polaron tunnelling (OLPT) conduction model is better suited for higher co-doping concentrations. By looking at scaling curves for imaginary impedance (Z'') and modulus (M''), thermally induced relaxation processes have been demonstrated. It can be shown from a comparison of the Z'' and M'' spectra that charge carrier motion, particularly the dominance of short-range charge carriers which is effective at low temperatures while long-range charge carriers which is effective at high temperatures, leads to dielectric relaxation. By looking at semi-circular arcs on the Nyquist plot, it can be shown that at high temperature the electrical conduction process for the nanocrystalline sample is influenced by both grain and grain boundaries contributions. According to the study of ac conductivity under different temperatures, all compounds transport electricity with the help of electronic hopping, oxygen vacancy movement, or/and the production of the defects.</p>","PeriodicalId":625,"journal":{"name":"Journal of Electroceramics","volume":"136 1","pages":""},"PeriodicalIF":1.7000,"publicationDate":"2024-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of Eu and Mn co-doping on temperature dependent dielectric relaxation behaviour and electric conduction mechanisms of bismuth ferrite\",\"authors\":\"Amod Kumar, Aliva Panigrahi, Mukesh Shekhar, Lawrence Kumar, Pawan Kumar\",\"doi\":\"10.1007/s10832-024-00346-0\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The temperature dependent microscopic conduction processes and dielectric relaxations in Eu and Mn co-doped multiferroic bismuth ferrite have been examined using complex frequency-dependent ac conductivity, electric modulus and complex impedance examinations. The modified Debye’s function was used to explore the dispersion behaviour of the dielectric constant. The correlated barrier hopping concept is supported by the frequency variation in ac conductivity at various temperatures, which follows Jonscher’s power law. It was observed that when the co-doping concentration is low, the thermally assisted correlated barrier hopping (CBH) conduction model is better suited for the present samples whereas the overlapping large polaron tunnelling (OLPT) conduction model is better suited for higher co-doping concentrations. By looking at scaling curves for imaginary impedance (Z'') and modulus (M''), thermally induced relaxation processes have been demonstrated. It can be shown from a comparison of the Z'' and M'' spectra that charge carrier motion, particularly the dominance of short-range charge carriers which is effective at low temperatures while long-range charge carriers which is effective at high temperatures, leads to dielectric relaxation. By looking at semi-circular arcs on the Nyquist plot, it can be shown that at high temperature the electrical conduction process for the nanocrystalline sample is influenced by both grain and grain boundaries contributions. According to the study of ac conductivity under different temperatures, all compounds transport electricity with the help of electronic hopping, oxygen vacancy movement, or/and the production of the defects.</p>\",\"PeriodicalId\":625,\"journal\":{\"name\":\"Journal of Electroceramics\",\"volume\":\"136 1\",\"pages\":\"\"},\"PeriodicalIF\":1.7000,\"publicationDate\":\"2024-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electroceramics\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1007/s10832-024-00346-0\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, CERAMICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electroceramics","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1007/s10832-024-00346-0","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, CERAMICS","Score":null,"Total":0}
Effect of Eu and Mn co-doping on temperature dependent dielectric relaxation behaviour and electric conduction mechanisms of bismuth ferrite
The temperature dependent microscopic conduction processes and dielectric relaxations in Eu and Mn co-doped multiferroic bismuth ferrite have been examined using complex frequency-dependent ac conductivity, electric modulus and complex impedance examinations. The modified Debye’s function was used to explore the dispersion behaviour of the dielectric constant. The correlated barrier hopping concept is supported by the frequency variation in ac conductivity at various temperatures, which follows Jonscher’s power law. It was observed that when the co-doping concentration is low, the thermally assisted correlated barrier hopping (CBH) conduction model is better suited for the present samples whereas the overlapping large polaron tunnelling (OLPT) conduction model is better suited for higher co-doping concentrations. By looking at scaling curves for imaginary impedance (Z'') and modulus (M''), thermally induced relaxation processes have been demonstrated. It can be shown from a comparison of the Z'' and M'' spectra that charge carrier motion, particularly the dominance of short-range charge carriers which is effective at low temperatures while long-range charge carriers which is effective at high temperatures, leads to dielectric relaxation. By looking at semi-circular arcs on the Nyquist plot, it can be shown that at high temperature the electrical conduction process for the nanocrystalline sample is influenced by both grain and grain boundaries contributions. According to the study of ac conductivity under different temperatures, all compounds transport electricity with the help of electronic hopping, oxygen vacancy movement, or/and the production of the defects.
期刊介绍:
While ceramics have traditionally been admired for their mechanical, chemical and thermal stability, their unique electrical, optical and magnetic properties have become of increasing importance in many key technologies including communications, energy conversion and storage, electronics and automation. Electroceramics benefit greatly from their versatility in properties including:
-insulating to metallic and fast ion conductivity
-piezo-, ferro-, and pyro-electricity
-electro- and nonlinear optical properties
-feromagnetism.
When combined with thermal, mechanical, and chemical stability, these properties often render them the materials of choice.
The Journal of Electroceramics is dedicated to providing a forum of discussion cutting across issues in electrical, optical, and magnetic ceramics. Driven by the need for miniaturization, cost, and enhanced functionality, the field of electroceramics is growing rapidly in many new directions. The Journal encourages discussions of resultant trends concerning silicon-electroceramic integration, nanotechnology, ceramic-polymer composites, grain boundary and defect engineering, etc.