新型 pH 值调节剂对弱碱性条件下用于钌基铜互连器件的铜膜化学机械抛光的影响

IF 1.8 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY ECS Journal of Solid State Science and Technology Pub Date : 2024-05-12 DOI:10.1149/2162-8777/ad4679
Changxin Dong, Xinhuan Niu, Jianghao Liu, Ni Zhan, Yida Zou, Chao He, Xinjie Li, Fu Luo, Yunhui Shi and Jiabao Cheng
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引用次数: 0

摘要

对于钌(Ru)基铜(Cu)互连器件 Cu 薄膜化学机械抛光(CMP)而言,在浆料中选择适当的 pH 值调节剂以确保化学反应并保持抛光化学环境的稳定性至关重要。本研究比较了无机 pH 调节剂 KOH、有机 pH 调节剂二乙醇胺(DEA)和 2-氨基-2-甲基-1-丙醇(AMP)对铜膜 CMP 和研磨液性能的影响。结果发现,使用 AMP 作为 pH 值调节剂时,Cu/Ru 去除率选择性(RRS)可达到 598:1,Cu 膜表面粗糙度降至 0.76 nm,浆料至少可保持稳定 7 d。同时,通过实验结果和测试分析证实,AMP 还能发挥络合剂、分散剂和表面活性剂的多功能作用。因此,在弱碱性泥浆中,AMP 可以替代 KOH 成为一种新的 pH 值调节剂。这一结果对优化铜膜 CMP 泥浆中有机 pH 调节剂的选择具有重要的指导作用。亮点 对于钌基铜互连铜膜化学机械抛光而言,在研磨液中选择合适的 pH 值调节剂对于保证化学反应的顺利进行和维持抛光化学环境的稳定至关重要。本文选择二乙醇胺和 2-氨基-2-甲基-1-丙醇作为有机 pH 值调节剂,以考察其环保、稳定、快速反应性能以及对铜膜化学机械抛光的影响。2- 氨基-2-甲基-1-丙醇还可以作为络合剂、分散剂和表面活性剂发挥多功能作用。当使用 AMP 作为 pH 调节剂时,铜/钌去除率选择性可达 598:1,铜膜表面粗糙度降至 0.76 nm,浆料至少可保持稳定 7 d。
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Effect of Novel pH Regulators on Copper film Chemical Mechanical Polishing for Ruthenium-Based Copper Interconnect under Weak Alkalinity Conditions
For Ruthenium (Ru)-based copper (Cu) interconnects Cu film chemical mechanical polishing (CMP), it is crucial to select appropriate pH regulators in the slurry to ensure the chemical reactions and maintain the stability of the polishing chemical environment. In this study, the effects of inorganic pH regulator KOH, organic pH regulator diethanolamine (DEA), and 2-amino-2-methyl-1-propanol (AMP) on CMP and slurry properties of Cu film were compared. It was found when using AMP as a pH regulator, the Cu/Ru removal rate selectivity (RRS) can reach 598:1, the surface roughness of Cu film decreased to 0.76 nm, and the slurry can remain stable for at least 7 d. The performance order of the three pH regulators is AMP>KOH>DEA. Meanwhile, through experimental results and test analysis, it has been confirmed that AMP can also play a multifunctional role as a complexing agent, dispersant, and surfactant. Therefore, AMP can replace KOH as a new pH regulator in weak alkaline slurries. This result plays an important role in guiding the selection of organic pH regulators in the optimization of Cu film CMP slurry. Highlights For Ruthenium-based copper interconnects copper film chemical mechanical polishing, it is crucial to select appropriate pH regulators in the slurry to ensure the chemical reactions and maintain the stability of the polishing chemical environment. In this paper, diethanolamine and 2-amino-2-methyl-1-propanol were selected as organic pH regulators for the properties of eco-friendly, stable, rapid reaction performance and the effects on copper film chemical mechanical polishing. 2-amino-2-methyl-1-propanol can also play a multifunctional role as a complexing agent, dispersant, and surfactant. When using AMP as a pH regulator, the copper/Ruthenium removal rate selectivity can reach 598:1, the surface roughness of copper film decreased to 0.76 nm, and the slurry can keep stability for at least 7 d. The application of multifunctional organic alkali in copper film chemical mechanical polishing will get more and more attention.
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来源期刊
ECS Journal of Solid State Science and Technology
ECS Journal of Solid State Science and Technology MATERIALS SCIENCE, MULTIDISCIPLINARY-PHYSICS, APPLIED
CiteScore
4.50
自引率
13.60%
发文量
455
期刊介绍: The ECS Journal of Solid State Science and Technology (JSS) was launched in 2012, and publishes outstanding research covering fundamental and applied areas of solid state science and technology, including experimental and theoretical aspects of the chemistry and physics of materials and devices. JSS has five topical interest areas: carbon nanostructures and devices dielectric science and materials electronic materials and processing electronic and photonic devices and systems luminescence and display materials, devices and processing.
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