{"title":"利用原位 X 射线光电子能谱对过渡金属氧化物进行适当的光谱分析","authors":"Dooyong Lee , Sungkyun Park","doi":"10.1016/j.cap.2024.05.007","DOIUrl":null,"url":null,"abstract":"<div><p>Transition metal oxides (TMOs) are one of the most exciting classes of materials due to their emergent phenomena over the past few decades. In general, the emergent phenomena in TMOs are driven by the chemical state of the TMOs. Therefore, it is vital to understand the correlation between the chemical state and the physical properties of the TMOs. X-ray photoelectron spectroscopy (XPS) is the most widely used method for analyzing the chemical state of materials. However, when using XPS to investigate the chemical properties of TMOs, a lack of clear theoretical explanations for the interpretation, including discussions of oxygen vacancies, inaccurate XPS peak fitting, and inaccurate calibration, often leads to misinterpretation. In this review, we present a brief introduction to XPS, the peak fitting/deconvolution method for analyzing the chemical state of TMOs, and several case studies that use XPS to correlate the chemical state and the physical properties of TMOs.</p></div>","PeriodicalId":11037,"journal":{"name":"Current Applied Physics","volume":"64 ","pages":"Pages 25-33"},"PeriodicalIF":2.4000,"publicationDate":"2024-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Proper spectroscopic analysis of transition metal oxides using ex-situ X-ray photoelectron spectroscopy\",\"authors\":\"Dooyong Lee , Sungkyun Park\",\"doi\":\"10.1016/j.cap.2024.05.007\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Transition metal oxides (TMOs) are one of the most exciting classes of materials due to their emergent phenomena over the past few decades. In general, the emergent phenomena in TMOs are driven by the chemical state of the TMOs. Therefore, it is vital to understand the correlation between the chemical state and the physical properties of the TMOs. X-ray photoelectron spectroscopy (XPS) is the most widely used method for analyzing the chemical state of materials. However, when using XPS to investigate the chemical properties of TMOs, a lack of clear theoretical explanations for the interpretation, including discussions of oxygen vacancies, inaccurate XPS peak fitting, and inaccurate calibration, often leads to misinterpretation. In this review, we present a brief introduction to XPS, the peak fitting/deconvolution method for analyzing the chemical state of TMOs, and several case studies that use XPS to correlate the chemical state and the physical properties of TMOs.</p></div>\",\"PeriodicalId\":11037,\"journal\":{\"name\":\"Current Applied Physics\",\"volume\":\"64 \",\"pages\":\"Pages 25-33\"},\"PeriodicalIF\":2.4000,\"publicationDate\":\"2024-05-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Current Applied Physics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1567173924000968\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Current Applied Physics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1567173924000968","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Proper spectroscopic analysis of transition metal oxides using ex-situ X-ray photoelectron spectroscopy
Transition metal oxides (TMOs) are one of the most exciting classes of materials due to their emergent phenomena over the past few decades. In general, the emergent phenomena in TMOs are driven by the chemical state of the TMOs. Therefore, it is vital to understand the correlation between the chemical state and the physical properties of the TMOs. X-ray photoelectron spectroscopy (XPS) is the most widely used method for analyzing the chemical state of materials. However, when using XPS to investigate the chemical properties of TMOs, a lack of clear theoretical explanations for the interpretation, including discussions of oxygen vacancies, inaccurate XPS peak fitting, and inaccurate calibration, often leads to misinterpretation. In this review, we present a brief introduction to XPS, the peak fitting/deconvolution method for analyzing the chemical state of TMOs, and several case studies that use XPS to correlate the chemical state and the physical properties of TMOs.
期刊介绍：
Current Applied Physics (Curr. Appl. Phys.) is a monthly published international journal covering all the fields of applied science investigating the physics of the advanced materials for future applications.
Other areas covered: Experimental and theoretical aspects of advanced materials and devices dealing with synthesis or structural chemistry, physical and electronic properties, photonics, engineering applications, and uniquely pertinent measurement or analytical techniques.
Current Applied Physics, published since 2001, covers physics, chemistry and materials science, including bio-materials, with their engineering aspects. It is a truly interdisciplinary journal opening a forum for scientists of all related fields, a unique point of the journal discriminating it from other worldwide and/or Pacific Rim applied physics journals.
Regular research papers, letters and review articles with contents meeting the scope of the journal will be considered for publication after peer review.
The Journal is owned by the Korean Physical Society.
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