用于软件缺陷预测的代码多视图超图表示学习

IF 5 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Transactions on Reliability Pub Date : 2024-03-15 DOI:10.1109/TR.2024.3393415
Shaojian Qiu;Mengyang Huang;Yun Liang;Chaoda Peng;Yuan Yuan
{"title":"用于软件缺陷预测的代码多视图超图表示学习","authors":"Shaojian Qiu;Mengyang Huang;Yun Liang;Chaoda Peng;Yuan Yuan","doi":"10.1109/TR.2024.3393415","DOIUrl":null,"url":null,"abstract":"Software defect prediction technology aids the reliability assurance team in identifying defect-prone code and assists the team in reasonably allocating limited testing resources. Recently, researchers assumed that the topological associations among code fragments could be harnessed to construct defect prediction models. Nevertheless, existing graph-based methods only concentrate on features of single-view association, which fail to fully capture the rich information hidden in the code. In addition, software defects may involve multiple code fragments simultaneously, but traditional binary graph structures are insufficient for representing these multivariate associations. To address these two challenges, this article proposes a multiview hypergraph representation learning approach (MVHR-DP) to amplify the potency of code features in defect prediction. MVHR-DP initiates by creating hypergraph structures for each code view, which are then amalgamated into a comprehensive fusion hypergraph. Following this, a hypergraph neural network is established to extract code features from multiple views and intricate associations, thereby enhancing the comprehensiveness of representation in the modeling data. Empirical study shows that the prediction model utilizing features generated by MVHR-DP exhibits superior area under the curve (AUC), F-measure, and matthews correlation coefficient (MCC) results compared to baseline approaches across within-project, cross-version, and cross-project prediction tasks.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"73 4","pages":"1863-1876"},"PeriodicalIF":5.0000,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Code Multiview Hypergraph Representation Learning for Software Defect Prediction\",\"authors\":\"Shaojian Qiu;Mengyang Huang;Yun Liang;Chaoda Peng;Yuan Yuan\",\"doi\":\"10.1109/TR.2024.3393415\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Software defect prediction technology aids the reliability assurance team in identifying defect-prone code and assists the team in reasonably allocating limited testing resources. Recently, researchers assumed that the topological associations among code fragments could be harnessed to construct defect prediction models. Nevertheless, existing graph-based methods only concentrate on features of single-view association, which fail to fully capture the rich information hidden in the code. In addition, software defects may involve multiple code fragments simultaneously, but traditional binary graph structures are insufficient for representing these multivariate associations. To address these two challenges, this article proposes a multiview hypergraph representation learning approach (MVHR-DP) to amplify the potency of code features in defect prediction. MVHR-DP initiates by creating hypergraph structures for each code view, which are then amalgamated into a comprehensive fusion hypergraph. Following this, a hypergraph neural network is established to extract code features from multiple views and intricate associations, thereby enhancing the comprehensiveness of representation in the modeling data. Empirical study shows that the prediction model utilizing features generated by MVHR-DP exhibits superior area under the curve (AUC), F-measure, and matthews correlation coefficient (MCC) results compared to baseline approaches across within-project, cross-version, and cross-project prediction tasks.\",\"PeriodicalId\":56305,\"journal\":{\"name\":\"IEEE Transactions on Reliability\",\"volume\":\"73 4\",\"pages\":\"1863-1876\"},\"PeriodicalIF\":5.0000,\"publicationDate\":\"2024-03-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Reliability\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10531109/\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10531109/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

摘要

软件缺陷预测技术帮助可靠性保证团队识别容易出现缺陷的代码,并帮助团队合理分配有限的测试资源。近年来,研究人员认为可以利用代码片段之间的拓扑关联来构建缺陷预测模型。然而,现有的基于图的方法只关注单视图关联的特征,无法充分捕获隐藏在代码中的丰富信息。此外,软件缺陷可能同时涉及多个代码片段,但是传统的二值图结构不足以表示这些多变量关联。为了解决这两个挑战,本文提出了一种多视图超图表示学习方法(MVHR-DP)来增强代码特征在缺陷预测中的效力。MVHR-DP通过为每个代码视图创建超图结构启动,然后将其合并为一个全面的融合超图。在此基础上,建立超图神经网络,从多个视图和复杂关联中提取代码特征,从而增强建模数据中表征的全面性。实证研究表明,与基线方法相比,利用MVHR-DP生成的特征的预测模型在项目内、跨版本和跨项目预测任务中表现出更优越的曲线下面积(AUC)、F-measure和马修斯相关系数(MCC)结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Code Multiview Hypergraph Representation Learning for Software Defect Prediction
Software defect prediction technology aids the reliability assurance team in identifying defect-prone code and assists the team in reasonably allocating limited testing resources. Recently, researchers assumed that the topological associations among code fragments could be harnessed to construct defect prediction models. Nevertheless, existing graph-based methods only concentrate on features of single-view association, which fail to fully capture the rich information hidden in the code. In addition, software defects may involve multiple code fragments simultaneously, but traditional binary graph structures are insufficient for representing these multivariate associations. To address these two challenges, this article proposes a multiview hypergraph representation learning approach (MVHR-DP) to amplify the potency of code features in defect prediction. MVHR-DP initiates by creating hypergraph structures for each code view, which are then amalgamated into a comprehensive fusion hypergraph. Following this, a hypergraph neural network is established to extract code features from multiple views and intricate associations, thereby enhancing the comprehensiveness of representation in the modeling data. Empirical study shows that the prediction model utilizing features generated by MVHR-DP exhibits superior area under the curve (AUC), F-measure, and matthews correlation coefficient (MCC) results compared to baseline approaches across within-project, cross-version, and cross-project prediction tasks.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
IEEE Transactions on Reliability
IEEE Transactions on Reliability 工程技术-工程:电子与电气
CiteScore
12.20
自引率
8.50%
发文量
153
审稿时长
7.5 months
期刊介绍: IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.
期刊最新文献
Table of Contents IEEE Reliability Society Information Editorial: Applied AI for Reliability and Cybersecurity 2024 Index IEEE Transactions on Reliability Vol. 73 Table of Contents
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1