Graham Gee, T. Bright, Amy Morgan, Carlie Atkinson, Shawana Andrews, Yvonne Clark, Karen Glover, T. Hirvonen, Elise Davis, Kimberley A. Jones, Rachel Reilly, Fiona K. Mensah, Madelyne Hudson-Buhagiar, S. Bennetts, H. Herrman, Helen Milroy, Andrew Mackinnon, Catherine Chamberlain
{"title":"土著居民和托雷斯海峡岛民复杂创伤与优势问卷:心理测量评估","authors":"Graham Gee, T. Bright, Amy Morgan, Carlie Atkinson, Shawana Andrews, Yvonne Clark, Karen Glover, T. Hirvonen, Elise Davis, Kimberley A. Jones, Rachel Reilly, Fiona K. Mensah, Madelyne Hudson-Buhagiar, S. Bennetts, H. Herrman, Helen Milroy, Andrew Mackinnon, Catherine Chamberlain","doi":"10.1080/00049530.2024.2335917","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Aboriginal and Torres Strait Islander Complex Trauma and Strengths Questionnaire: psychometric evaluation\",\"authors\":\"Graham Gee, T. Bright, Amy Morgan, Carlie Atkinson, Shawana Andrews, Yvonne Clark, Karen Glover, T. Hirvonen, Elise Davis, Kimberley A. Jones, Rachel Reilly, Fiona K. Mensah, Madelyne Hudson-Buhagiar, S. Bennetts, H. Herrman, Helen Milroy, Andrew Mackinnon, Catherine Chamberlain\",\"doi\":\"10.1080/00049530.2024.2335917\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"102\",\"ListUrlMain\":\"https://doi.org/10.1080/00049530.2024.2335917\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"102","ListUrlMain":"https://doi.org/10.1080/00049530.2024.2335917","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}