AiTO:利用 GNN 和 RL 同时优化栅极尺寸和缓冲器插入以实现时序优化

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Integration-The Vlsi Journal Pub Date : 2024-05-21 DOI:10.1016/j.vlsi.2024.102211
Hongxi Wu , Zhipeng Huang , Xingquan Li , Wenxing Zhu
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引用次数: 0

摘要

在电子设计自动化(EDA)流程中,为优化时序而进行的栅极尺寸调整和缓冲器插入工作被广泛采用。它们的目的都是调整栅极/缓冲器的上下游电容,以尽量减少延迟。然而,现有的大部分工作都集中在门大小或缓冲器插入的独立方面。本文提出了一种基于学习的时序优化框架 AiTO,它将强化学习与图神经网络相结合,可同时执行门大小调整和缓冲区插入。我们通过提前确定可能的缓冲区位置,将缓冲区插入作为一种特殊的栅极选型,并将缓冲区插入和栅极选型视为一个 RL 过程。10 个实际设计(28 纳米和 110 纳米)的实验结果表明,AiTO 比 OpenROAD 能获得更好的最差负松弛(WNS)优化结果,同时在一定程度上改善了商业工具 Innovus 的结果。此外,烧蚀研究还证明了同时执行栅极尺寸和缓冲器插入以进行时序优化的好处。
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AiTO: Simultaneous gate sizing and buffer insertion for timing optimization with GNNs and RL

Gate sizing and buffer insertion for timing optimization are performed extensively in electronic design automation (EDA) flows. Both of them aim to adjust the upstream and downstream capacitances of gates/buffers to minimize delay. However, most of existing work focuses on gate sizing or buffer insertion independently. This paper proposes a learning-based timing optimization framework, AiTO, that combines reinforcement learning with graph neural network, to perform simultaneously gate sizing and buffer insertion. We model buffer insertion as a special gate sizing by determining possible buffer locations in advance and treating the buffer insertion and gate sizing as an RL process. Experimental results on 10 real designs (28-nm and 110-nm) show that, AiTO can achieve better worst negative slack (WNS) optimization results than OpenROAD while being able to improve the results of the commercial tool, Innovus, to some extent. Moreover, ablation studies demonstrate the benefits of performing simultaneous gate sizing and buffer insertion for timing optimization.

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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
期刊最新文献
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