缺陷在提高卷对卷 PLD (Eu,Er)Ba2Cu3Oy+BaHfO3 涂层导体临界电流密度中的作用

IF 1.5 4区 物理与天体物理 Q3 PHYSICS, APPLIED Japanese Journal of Applied Physics Pub Date : 2024-06-04 DOI:10.35848/1347-4065/ad45d0
Takumi Suzuki, Keita Sakuma, Junya Ohta, Yuki Ogimoto, Ko Takahashi, Toshinori Ozaki, Akira Ibi, Teruo Izumi, Tetsuya Yamaki, Hiroyuki Okazaki, Shunya Yamamoto, Hiroshi Koshikawa, Tatsunori Okada, Satoshi Awaji and Masashi Miura
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引用次数: 0

摘要

REBa2Cu3Oy (REBCO) 涂层导体 (CCs) 具有优异的超导特性,预计可用于各种磁体应用。为了进一步将这些材料的临界电流密度 Jc 提高到商业应用所需的水平,本研究采用卷对卷(RTR)脉冲激光沉积(PLD)技术制造 REBCO+BaHfO3 (BHO) CCs。PLD 生成 BHO 纳米棒,作为磁通引脚缺陷。对材料进行 O2+ 辐照可引入更多缺陷。与传统的 REBCO+BHO-nanorod CCs 相比,辐照诱导的缺陷可作为 REBCO+BHO-nanorod CCs 的磁通引中心,沿 c 轴并在宽磁场角范围内提高 Jc。在这种材料中,纳米棒和辐照诱导的缺陷都被证明是有效的引脚中心。
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Role of defects in increasing the critical current density of reel-to-reel PLD (Eu,Er)Ba2Cu3Oy+BaHfO3-coated conductors
Given their excellent superconducting properties, REBa2Cu3Oy (REBCO)-coated conductors (CCs) are anticipated to be utilized in a variety of magnet applications. To further increase the critical current density Jc of these materials to levels needed for commercial applications, this study employs reel-to-reel (RTR) pulsed laser deposition (PLD) to fabricate REBCO+BaHfO3 (BHO) CCs. PLD creates BHO nanorods, which serve as flux-pinning defects. The material is subjected to O2+ irradiation to introduce more defects. The irradiation-induced defects serve as flux-pinning centers to the REBCO+BHO-nanorod CCs, increasing Jc along the c axis and over a wide range of magnetic-field angles compared with conventional REBCO+BHO-nanorod CCs. Both nanorods and irradiation-induced defects are demonstrated to be effective pinning centers in this material.
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来源期刊
Japanese Journal of Applied Physics
Japanese Journal of Applied Physics 物理-物理:应用
CiteScore
3.00
自引率
26.70%
发文量
818
审稿时长
3.5 months
期刊介绍: The Japanese Journal of Applied Physics (JJAP) is an international journal for the advancement and dissemination of knowledge in all fields of applied physics. JJAP is a sister journal of the Applied Physics Express (APEX) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP). JJAP publishes articles that significantly contribute to the advancements in the applications of physical principles as well as in the understanding of physics in view of particular applications in mind. Subjects covered by JJAP include the following fields: • Semiconductors, dielectrics, and organic materials • Photonics, quantum electronics, optics, and spectroscopy • Spintronics, superconductivity, and strongly correlated materials • Device physics including quantum information processing • Physics-based circuits and systems • Nanoscale science and technology • Crystal growth, surfaces, interfaces, thin films, and bulk materials • Plasmas, applied atomic and molecular physics, and applied nuclear physics • Device processing, fabrication and measurement technologies, and instrumentation • Cross-disciplinary areas such as bioelectronics/photonics, biosensing, environmental/energy technologies, and MEMS
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