{"title":"先进制造业的综合计量","authors":"","doi":"10.1016/j.cirp.2024.05.003","DOIUrl":null,"url":null,"abstract":"<div><p>The transition from conventional standalone metrology to integrated metrology has been accelerating in advanced manufacturing over the past decade. This keynote paper defines the concept of integrated metrology, which extends beyond parts inspection and encompasses processes and manufacturing equipment to enhance efficiency and productivity. The paper presents the characteristics, benefits, constraints, and future possibilities of integrated metrology for parts, processes, and equipment. It also includes a classification of the physical quantities of measurands, the corresponding measuring instruments, data and communication methods, uncertainty, and traceability. The paper also discusses future challenges and emerging trends.</p></div>","PeriodicalId":55256,"journal":{"name":"Cirp Annals-Manufacturing Technology","volume":"73 2","pages":"Pages 639-665"},"PeriodicalIF":3.2000,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0007850624001197/pdfft?md5=e443dcf07c88babccf3cb1f32c05ced3&pid=1-s2.0-S0007850624001197-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Integrated metrology for advanced manufacturing\",\"authors\":\"\",\"doi\":\"10.1016/j.cirp.2024.05.003\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The transition from conventional standalone metrology to integrated metrology has been accelerating in advanced manufacturing over the past decade. This keynote paper defines the concept of integrated metrology, which extends beyond parts inspection and encompasses processes and manufacturing equipment to enhance efficiency and productivity. The paper presents the characteristics, benefits, constraints, and future possibilities of integrated metrology for parts, processes, and equipment. It also includes a classification of the physical quantities of measurands, the corresponding measuring instruments, data and communication methods, uncertainty, and traceability. The paper also discusses future challenges and emerging trends.</p></div>\",\"PeriodicalId\":55256,\"journal\":{\"name\":\"Cirp Annals-Manufacturing Technology\",\"volume\":\"73 2\",\"pages\":\"Pages 639-665\"},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2024-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S0007850624001197/pdfft?md5=e443dcf07c88babccf3cb1f32c05ced3&pid=1-s2.0-S0007850624001197-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Cirp Annals-Manufacturing Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0007850624001197\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, INDUSTRIAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Cirp Annals-Manufacturing Technology","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0007850624001197","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, INDUSTRIAL","Score":null,"Total":0}
The transition from conventional standalone metrology to integrated metrology has been accelerating in advanced manufacturing over the past decade. This keynote paper defines the concept of integrated metrology, which extends beyond parts inspection and encompasses processes and manufacturing equipment to enhance efficiency and productivity. The paper presents the characteristics, benefits, constraints, and future possibilities of integrated metrology for parts, processes, and equipment. It also includes a classification of the physical quantities of measurands, the corresponding measuring instruments, data and communication methods, uncertainty, and traceability. The paper also discusses future challenges and emerging trends.
期刊介绍：
CIRP, The International Academy for Production Engineering, was founded in 1951 to promote, by scientific research, the development of all aspects of manufacturing technology covering the optimization, control and management of processes, machines and systems.
This biannual ISI cited journal contains approximately 140 refereed technical and keynote papers. Subject areas covered include:
Assembly, Cutting, Design, Electro-Physical and Chemical Processes, Forming, Abrasive processes, Surfaces, Machines, Production Systems and Organizations, Precision Engineering and Metrology, Life-Cycle Engineering, Microsystems Technology (MST), Nanotechnology.
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