针对 IMC 应用的 10T SRAM 架构,通过 CIFAR-10 数据集进行基准测试,吞吐量提高了 40

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Integration-The Vlsi Journal Pub Date : 2024-06-05 DOI:10.1016/j.vlsi.2024.102225
Ravi S. Siddanath, Mohit Gupta, Chaitanya Joshi, Manish Goswami, Kavindra Kandpal
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引用次数: 0

摘要

本研究论文介绍了一种内存架构,它能处理标准内存存储操作,并实现内存计算,超越了传统 SRAM 位元组的能力。本文提出的架构有效地消除了读取干扰问题,方便了 NAND、NOR 和 XNOR 等位运算,而且无需复杂的模拟外围电路。与现有的内存计算(IMC)位元架构相比,建议的位元架构可提供更高的吞吐量,使其成为更适合 IMC 应用的设计。由于独特的位元架构允许在一个周期内同时完成所有的位操作,因此并行性提高了吞吐量。利用联电 28 纳米 PDK 晶体管模型,通过蒙特卡洛变化分析确认了建议架构的有效性,以确保其稳健性。此外,还利用 CIFAR-10 数据集对架构进行了基准测试,通过 NeuroSim 模拟器评估了各种机器学习模型的性能。与现有架构相比,拟议架构的吞吐量(TOPS/W)大幅提高了 40%。利用精确的 Monte-Carlo 模拟(1000 个样本),在最坏情况下的 PVT 角(变化率高达 6σ)验证了所提出的 10T 位元的稳定性。
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A 10T SRAM architecture with 40 % enhanced throughput for IMC applications benchmarked with CIFAR-10 dataset

This research paper introduces a memory architecture that handles standard memory storage operations and enables in-memory computations, surpassing the capabilities of conventional SRAM bit-cells. The proposed architecture in this work effectively eliminates read-disturb issues and facilitates bit-wise operations like NAND, NOR, and XNOR, all without requiring intricate analog peripheral circuits. The suggested bit-cell architecture offers enhanced throughput compared to existing In-Memory Computing (IMC) bit-cell architectures, making it a more suitable design for IMC applications. Parallelism offers enhanced throughput due to the unique bit-cell architecture, which allows all the bit-wise operations to be achieved simultaneously in a single cycle. The validity of the suggested architecture has been confirmed through Monte-Carlo variation analysis, utilizing UMC 28 nm PDK transistor models to ensure its robustness. Furthermore, architecture is benchmarked using the CIFAR-10 dataset, which entails assessing its performance across various machine learning models via the NeuroSim Simulator. The proposed architecture offers a substantial increase of up to 40 % in throughput (TOPS/W) compared to the existing architectures. Utilizing accurate Monte-Carlo simulations with 1000 samples, the stability of the proposed 10T bit-cell is validated at worst-case PVT corners, up to 6σ variations.

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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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