Ravi S. Siddanath, Mohit Gupta, Chaitanya Joshi, Manish Goswami, Kavindra Kandpal
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A 10T SRAM architecture with 40 % enhanced throughput for IMC applications benchmarked with CIFAR-10 dataset
This research paper introduces a memory architecture that handles standard memory storage operations and enables in-memory computations, surpassing the capabilities of conventional SRAM bit-cells. The proposed architecture in this work effectively eliminates read-disturb issues and facilitates bit-wise operations like NAND, NOR, and XNOR, all without requiring intricate analog peripheral circuits. The suggested bit-cell architecture offers enhanced throughput compared to existing In-Memory Computing (IMC) bit-cell architectures, making it a more suitable design for IMC applications. Parallelism offers enhanced throughput due to the unique bit-cell architecture, which allows all the bit-wise operations to be achieved simultaneously in a single cycle. The validity of the suggested architecture has been confirmed through Monte-Carlo variation analysis, utilizing UMC 28 nm PDK transistor models to ensure its robustness. Furthermore, architecture is benchmarked using the CIFAR-10 dataset, which entails assessing its performance across various machine learning models via the NeuroSim Simulator. The proposed architecture offers a substantial increase of up to 40 % in throughput (TOPS/W) compared to the existing architectures. Utilizing accurate Monte-Carlo simulations with 1000 samples, the stability of the proposed 10T bit-cell is validated at worst-case PVT corners, up to 6σ variations.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.