W. Albanda, M. H. Saeed, M. Z. Abdullah, M. Al-Timimi
{"title":"厚度变化对 CdS.MgO 薄膜某些物理性质的影响氧化镁薄膜","authors":"W. Albanda, M. H. Saeed, M. Z. Abdullah, M. Al-Timimi","doi":"10.15251/cl.2024.215.439","DOIUrl":null,"url":null,"abstract":"In this study, CdS: MgO films were synthesized using the chemical spray pyrolysis method, varying the film thickness. X-ray diffraction (XRD) analysis confirmed the polycrystalline nature of the films, with an observed increase in average crystallite size corresponding to thicker films, and The films' surface morphology indicates an absence of crystal defects such as holes and voids . The investigation of energy gap and optical parameters revealed a dependency on film thickness, with the energy gap shifting from 2.412 eV for a thickness of 150 nm to 2.354 eV for a thickness of 750 nm. Hall effect measurements demonstrated an augmentation in carrier concentration with increasing film thickness. The findings suggest a substantial influence of thickness on the physical properties of CdS: MgO thin films. Notably, thicker films exhibit characteristics that make them promising candidates for application as absorber layers in solar cells. This research provides valuable insights into tailoring the properties of these films for optimal performance in solar energy conversion devices, emphasizing the importance of controlling thickness in achieving desired electronic and optical characteristics.","PeriodicalId":9710,"journal":{"name":"Chalcogenide Letters","volume":null,"pages":null},"PeriodicalIF":1.2000,"publicationDate":"2024-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Thickness variation on some physical properties of CdS: MgO films\",\"authors\":\"W. Albanda, M. H. Saeed, M. Z. Abdullah, M. Al-Timimi\",\"doi\":\"10.15251/cl.2024.215.439\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, CdS: MgO films were synthesized using the chemical spray pyrolysis method, varying the film thickness. X-ray diffraction (XRD) analysis confirmed the polycrystalline nature of the films, with an observed increase in average crystallite size corresponding to thicker films, and The films' surface morphology indicates an absence of crystal defects such as holes and voids . The investigation of energy gap and optical parameters revealed a dependency on film thickness, with the energy gap shifting from 2.412 eV for a thickness of 150 nm to 2.354 eV for a thickness of 750 nm. Hall effect measurements demonstrated an augmentation in carrier concentration with increasing film thickness. The findings suggest a substantial influence of thickness on the physical properties of CdS: MgO thin films. Notably, thicker films exhibit characteristics that make them promising candidates for application as absorber layers in solar cells. This research provides valuable insights into tailoring the properties of these films for optimal performance in solar energy conversion devices, emphasizing the importance of controlling thickness in achieving desired electronic and optical characteristics.\",\"PeriodicalId\":9710,\"journal\":{\"name\":\"Chalcogenide Letters\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2024-06-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Chalcogenide Letters\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.15251/cl.2024.215.439\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Chalcogenide Letters","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.15251/cl.2024.215.439","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Thickness variation on some physical properties of CdS: MgO films
In this study, CdS: MgO films were synthesized using the chemical spray pyrolysis method, varying the film thickness. X-ray diffraction (XRD) analysis confirmed the polycrystalline nature of the films, with an observed increase in average crystallite size corresponding to thicker films, and The films' surface morphology indicates an absence of crystal defects such as holes and voids . The investigation of energy gap and optical parameters revealed a dependency on film thickness, with the energy gap shifting from 2.412 eV for a thickness of 150 nm to 2.354 eV for a thickness of 750 nm. Hall effect measurements demonstrated an augmentation in carrier concentration with increasing film thickness. The findings suggest a substantial influence of thickness on the physical properties of CdS: MgO thin films. Notably, thicker films exhibit characteristics that make them promising candidates for application as absorber layers in solar cells. This research provides valuable insights into tailoring the properties of these films for optimal performance in solar energy conversion devices, emphasizing the importance of controlling thickness in achieving desired electronic and optical characteristics.
期刊介绍:
Chalcogenide Letters (CHL) has the aim to publish rapidly papers in chalcogenide field of research and
appears with twelve issues per year. The journal is open to letters, short communications and breakings news
inserted as Short Notes, in the field of chalcogenide materials either amorphous or crystalline. Short papers in
structure, properties and applications, as well as those covering special properties in nano-structured
chalcogenides are admitted.