Fa-Jun Ma , Guo Li , Xutao Wang , Haoran Wang , Zhuangyi Zhou , Chukwuka Uzochukwu Madumelu , Peter Toth , Nicholas J. Ekins-Daukes , Gavin Conibeer , Bram Hoex
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The investigation reveals that when utilizing substrates with high doping levels, both PERC and TOPCon cells exhibit nearly identical beginning-of-life (BOL) and end-of-life (EOL) performance. However, with lower substrate doping concentrations, both technologies show improved BOL efficiency. Notably, this enhanced BOL efficiency does not translate into superior EOL efficiency. This distinction in EOL efficiency can be attributed to two primary factors triggered by radiation exposure. Firstly, the emergence of defects leads to a reduction in open-circuit voltage. Secondly, dopant compensation contributes to an increase in series resistance. Specifically, for PERC cells, the challenge of elevated series resistance is further exacerbated by the requirement for majority carriers to traverse both vertically and laterally to reach the rear metal contact. 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引用次数: 0
摘要
本研究对 PERC 和 TOPCon 技术进行了全面的数值评估,重点关注辐射引起的缺陷的影响。这项评估针对的是 p 型硅太阳能电池,因为它们本质上更能抵御辐射缺陷。通过严格校准重组参数、辐射诱导缺陷曲线和其他相关细节,为深入比较两种结构在空间条件下的性能特征奠定了坚实的基础。研究结果表明,当使用高掺杂水平的衬底时,PERC 和 TOPCon 电池的寿命初期(BOL)和寿命末期(EOL)性能几乎完全相同。然而,当衬底掺杂浓度较低时,这两种技术的 BOL 效率都有所提高。值得注意的是,BOL 效率的提高并没有转化为 EOL 效率的提高。EOL 效率的这种差异可归因于辐射照射引发的两个主要因素。首先,缺陷的出现导致开路电压降低。其次,掺杂补偿导致串联电阻增加。具体来说,对于 PERC 电池而言,由于多数载流子需要垂直和横向穿越才能到达后部金属触点,串联电阻升高的挑战进一步加剧。如果缺乏稳健的缺陷恢复机制或弹性盖板玻璃,掺杂水平较低的基底就更容易受到辐射诱导的缺陷和随后的掺杂补偿的不利影响。在这种情况下,与 PERC 相比,TOPCon 技术具有显著的优势,尤其是在高电子流情况下,因为它对少数电荷载流子和多数电荷载流子都具有全面积接触。
Comparative analysis of radiation-induced effects on the performance of p-type PERC and TOPCon solar cells for space applications
This work presents a comprehensive numerical evaluation of PERC and TOPCon technologies, focusing on the impact of radiation-induced defects. This assessment is conducted for p-type silicon solar cells as they are intrinsically more resistant to radiation defects. By rigorously calibrating recombination parameters, radiation-induced defect profiles, and other pertinent details, a robust basis is established for an in-depth comparison of the performance characteristics displayed by both architectures under space conditions. The investigation reveals that when utilizing substrates with high doping levels, both PERC and TOPCon cells exhibit nearly identical beginning-of-life (BOL) and end-of-life (EOL) performance. However, with lower substrate doping concentrations, both technologies show improved BOL efficiency. Notably, this enhanced BOL efficiency does not translate into superior EOL efficiency. This distinction in EOL efficiency can be attributed to two primary factors triggered by radiation exposure. Firstly, the emergence of defects leads to a reduction in open-circuit voltage. Secondly, dopant compensation contributes to an increase in series resistance. Specifically, for PERC cells, the challenge of elevated series resistance is further exacerbated by the requirement for majority carriers to traverse both vertically and laterally to reach the rear metal contact. When a robust defect recovery mechanism or resilient cover glass is absent, substrates characterized by lower doping levels display increased susceptibility to the adverse effects of radiation-induced defects and the subsequent dopant compensation. Under these circumstances, the TOPCon technology demonstrates a significant advantage over PERC, particularly for high electron fluence due to its full area contacts for both minority and majority charge carriers.
期刊介绍:
Solar Energy Materials & Solar Cells is intended as a vehicle for the dissemination of research results on materials science and technology related to photovoltaic, photothermal and photoelectrochemical solar energy conversion. Materials science is taken in the broadest possible sense and encompasses physics, chemistry, optics, materials fabrication and analysis for all types of materials.