Janusz Rajski, Vivek Chickermane, Jean-François Côté, Stephan Eggersglüß, Nilanjan Mukherjee, Jerzy Tyszer
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引用次数: 0
摘要
编者按汽车电子和数据中心等安全关键型应用需要高可靠性。在硅片生命周期中整合测试设计（DFT）可应对系统内和现场操作的挑战，本文对此进行了综述。- Mehdi B. Tahoori，德国卡尔斯鲁厄理工学院
The Future of Design for Test and Silicon Lifecycle Management
Editor’s notes: Safety-critical applications, such as automotive electronics and data centers, demand high reliability. Integrating design-for-test (DFT) across silicon lifecycle addresses challenges for in-system and in-field operations, which are reviewed in this article. — Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany
期刊介绍：
Accounts of Chemical Research presents short, concise and critical articles offering easy-to-read overviews of basic research and applications in all areas of chemistry and biochemistry. These short reviews focus on research from the author’s own laboratory and are designed to teach the reader about a research project. In addition, Accounts of Chemical Research publishes commentaries that give an informed opinion on a current research problem. Special Issues online are devoted to a single topic of unusual activity and significance.
Accounts of Chemical Research replaces the traditional article abstract with an article "Conspectus." These entries synopsize the research affording the reader a closer look at the content and significance of an article. Through this provision of a more detailed description of the article contents, the Conspectus enhances the article's discoverability by search engines and the exposure for the research.
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