Fernando Morilla, Jesús Vega, Sebastián Dormido-Canto, Amor Romero-Maestre, José de-Martín-Hernández, Yolanda Morilla, Pedro Martín-Holgado, Manuel Domínguez
{"title":"预测微电子元件辐射效应的机器学习方法","authors":"Fernando Morilla, Jesús Vega, Sebastián Dormido-Canto, Amor Romero-Maestre, José de-Martín-Hernández, Yolanda Morilla, Pedro Martín-Holgado, Manuel Domínguez","doi":"10.3390/s24134276","DOIUrl":null,"url":null,"abstract":"This paper presents an innovative technique, Advanced Predictor of Electrical Parameters, based on machine learning methods to predict the degradation of electronic components under the effects of radiation. The term degradation refers to the way in which electrical parameters of the electronic components vary with the irradiation dose. This method consists of two sequential steps defined as ‘recognition of degradation patterns in the database’ and ‘degradation prediction of new samples without any kind of irradiation’. The technique can be used under two different approaches called ‘pure data driven’ and ‘model based’. In this paper, the use of Advanced Predictor of Electrical Parameters is shown for bipolar transistors, but the methodology is sufficiently general to be applied to any other component.","PeriodicalId":21698,"journal":{"name":"Sensors","volume":null,"pages":null},"PeriodicalIF":3.4000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Machine Learning Approach to Predict Radiation Effects in Microelectronic Components\",\"authors\":\"Fernando Morilla, Jesús Vega, Sebastián Dormido-Canto, Amor Romero-Maestre, José de-Martín-Hernández, Yolanda Morilla, Pedro Martín-Holgado, Manuel Domínguez\",\"doi\":\"10.3390/s24134276\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an innovative technique, Advanced Predictor of Electrical Parameters, based on machine learning methods to predict the degradation of electronic components under the effects of radiation. The term degradation refers to the way in which electrical parameters of the electronic components vary with the irradiation dose. This method consists of two sequential steps defined as ‘recognition of degradation patterns in the database’ and ‘degradation prediction of new samples without any kind of irradiation’. The technique can be used under two different approaches called ‘pure data driven’ and ‘model based’. In this paper, the use of Advanced Predictor of Electrical Parameters is shown for bipolar transistors, but the methodology is sufficiently general to be applied to any other component.\",\"PeriodicalId\":21698,\"journal\":{\"name\":\"Sensors\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2024-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Sensors\",\"FirstCategoryId\":\"103\",\"ListUrlMain\":\"https://doi.org/10.3390/s24134276\",\"RegionNum\":3,\"RegionCategory\":\"综合性期刊\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, ANALYTICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensors","FirstCategoryId":"103","ListUrlMain":"https://doi.org/10.3390/s24134276","RegionNum":3,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, ANALYTICAL","Score":null,"Total":0}
A Machine Learning Approach to Predict Radiation Effects in Microelectronic Components
This paper presents an innovative technique, Advanced Predictor of Electrical Parameters, based on machine learning methods to predict the degradation of electronic components under the effects of radiation. The term degradation refers to the way in which electrical parameters of the electronic components vary with the irradiation dose. This method consists of two sequential steps defined as ‘recognition of degradation patterns in the database’ and ‘degradation prediction of new samples without any kind of irradiation’. The technique can be used under two different approaches called ‘pure data driven’ and ‘model based’. In this paper, the use of Advanced Predictor of Electrical Parameters is shown for bipolar transistors, but the methodology is sufficiently general to be applied to any other component.
期刊介绍:
Sensors (ISSN 1424-8220) provides an advanced forum for the science and technology of sensors and biosensors. It publishes reviews (including comprehensive reviews on the complete sensors products), regular research papers and short notes. Our aim is to encourage scientists to publish their experimental and theoretical results in as much detail as possible. There is no restriction on the length of the papers. The full experimental details must be provided so that the results can be reproduced.