Mile Gao, Paul L. Burn, Gytis Juška, Almantas Pivrikas
{"title":"利用线性增加电压的注入式金属-绝缘体-半导体电荷提取法测量有机半导体中的非平衡电荷载流子迁移率","authors":"Mile Gao, Paul L. Burn, Gytis Juška, Almantas Pivrikas","doi":"10.1002/adpr.202300325","DOIUrl":null,"url":null,"abstract":"<p>The charge carrier mobility in tris(4-carbazoyl-9-ylphenyl)amine (TCTA), a host and hole transport material typically used in organic light-emitting diodes (OLEDs), is measured using charge carrier electrical injection metal–insulator–semiconductor charge extraction by linearly increasing voltage (i-MIS-CELIV). By employing the injection current i-MIS-CELIV method, charge transport at time scales shorter than the transit times typically observed in standard MIS-CELIV is measured. The i-MIS-CELIV technique enables the experimental measurement of unequilibrated and pretrapped charge carriers. Through a comparison of injection and extraction current transients obtained from i-MIS-CELIV and MIS-CELIV, it is concluded that hole trapping is negligible in evaporated neat films of TCTA within the time-scales relevant to the operational conditions of optoelectronic devices, such as OLEDs. Furthermore, photocarrier generation in conjunction with i-MIS-CELIV (photo-i-MIS-CELIV) to quantify the properties of charge injection from the electrode to the semiconductor of the MIS devices is utilized. Based on the photo-i-MIS-CELIV measurements, it is observed that the contact resistance does not limit the injection current at the TCTA/molybdenum oxide/silver interface. Therefore, when TCTA is employed as the hole transport/electron-blocking layer in OLEDs, it does not significantly reduce the injection current and remains compatible with the high injection current densities required for efficient OLED operation.</p>","PeriodicalId":7263,"journal":{"name":"Advanced Photonics Research","volume":null,"pages":null},"PeriodicalIF":3.7000,"publicationDate":"2024-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/adpr.202300325","citationCount":"0","resultStr":"{\"title\":\"Unequilibrated Charge Carrier Mobility in Organic Semiconductors Measured Using Injection Metal–Insulator–Semiconductor Charge Extraction by Linearly Increasing Voltage\",\"authors\":\"Mile Gao, Paul L. Burn, Gytis Juška, Almantas Pivrikas\",\"doi\":\"10.1002/adpr.202300325\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The charge carrier mobility in tris(4-carbazoyl-9-ylphenyl)amine (TCTA), a host and hole transport material typically used in organic light-emitting diodes (OLEDs), is measured using charge carrier electrical injection metal–insulator–semiconductor charge extraction by linearly increasing voltage (i-MIS-CELIV). By employing the injection current i-MIS-CELIV method, charge transport at time scales shorter than the transit times typically observed in standard MIS-CELIV is measured. The i-MIS-CELIV technique enables the experimental measurement of unequilibrated and pretrapped charge carriers. Through a comparison of injection and extraction current transients obtained from i-MIS-CELIV and MIS-CELIV, it is concluded that hole trapping is negligible in evaporated neat films of TCTA within the time-scales relevant to the operational conditions of optoelectronic devices, such as OLEDs. Furthermore, photocarrier generation in conjunction with i-MIS-CELIV (photo-i-MIS-CELIV) to quantify the properties of charge injection from the electrode to the semiconductor of the MIS devices is utilized. Based on the photo-i-MIS-CELIV measurements, it is observed that the contact resistance does not limit the injection current at the TCTA/molybdenum oxide/silver interface. Therefore, when TCTA is employed as the hole transport/electron-blocking layer in OLEDs, it does not significantly reduce the injection current and remains compatible with the high injection current densities required for efficient OLED operation.</p>\",\"PeriodicalId\":7263,\"journal\":{\"name\":\"Advanced Photonics Research\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.7000,\"publicationDate\":\"2024-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.1002/adpr.202300325\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Photonics Research\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/adpr.202300325\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Photonics Research","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/adpr.202300325","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Unequilibrated Charge Carrier Mobility in Organic Semiconductors Measured Using Injection Metal–Insulator–Semiconductor Charge Extraction by Linearly Increasing Voltage
The charge carrier mobility in tris(4-carbazoyl-9-ylphenyl)amine (TCTA), a host and hole transport material typically used in organic light-emitting diodes (OLEDs), is measured using charge carrier electrical injection metal–insulator–semiconductor charge extraction by linearly increasing voltage (i-MIS-CELIV). By employing the injection current i-MIS-CELIV method, charge transport at time scales shorter than the transit times typically observed in standard MIS-CELIV is measured. The i-MIS-CELIV technique enables the experimental measurement of unequilibrated and pretrapped charge carriers. Through a comparison of injection and extraction current transients obtained from i-MIS-CELIV and MIS-CELIV, it is concluded that hole trapping is negligible in evaporated neat films of TCTA within the time-scales relevant to the operational conditions of optoelectronic devices, such as OLEDs. Furthermore, photocarrier generation in conjunction with i-MIS-CELIV (photo-i-MIS-CELIV) to quantify the properties of charge injection from the electrode to the semiconductor of the MIS devices is utilized. Based on the photo-i-MIS-CELIV measurements, it is observed that the contact resistance does not limit the injection current at the TCTA/molybdenum oxide/silver interface. Therefore, when TCTA is employed as the hole transport/electron-blocking layer in OLEDs, it does not significantly reduce the injection current and remains compatible with the high injection current densities required for efficient OLED operation.