通过煅烧温度提高纳米结构二氧化钛薄膜在太阳能电池应用中的性能

Energies Pub Date : 2024-07-11 DOI:10.3390/en17143415
Nurliyana Mohamad Arifin, Ervina Efzan Binti Mhd Noor, F. Mohamad, Norhidayah Mohamad, Nur Haslinda Mohamed Muzni
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摘要

本研究采用溶胶-凝胶旋涂法在掺氟氧化锡(FTO)基底上沉积二氧化钛(TiO2)。通过对薄膜进行煅烧处理,观察到其在结构、光学和形态特性方面均有所提高。研究人员探索了不同的煅烧温度,并确定在 600 °C 下退火的 TiO2 为最佳样品。对 X 射线衍射光谱(XRD)图的分析表明,(101) 的取向面很突出,这表明在该温度下存在锐钛矿型二氧化钛,且呈四方型。尽管光学光谱存在波动,但在波长为 400 纳米的可见光区域观察到的最高透射率为 80%。带隙值估计为 3.45 eV,再次证实了二氧化钛的特性。表面分析表明,TiO2 生长均匀,均匀地覆盖了 FTO 基底。横截面检查显示,TiO2 薄膜厚度为 263 nm,致密而紧密。薄膜上没有缺陷或气孔,这反映出薄膜具有良好的组织结构和高质量的形成。观察到显著的电气整流特性,表明 p-n 结的成功形成。总之,煅烧处理对提高薄膜的性能至关重要,这凸显了煅烧处理在太阳能电池应用开发中的重要意义。
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Enhancing the Properties of Nanostructure TiO2 Thin Film via Calcination Temperature for Solar Cell Application
In this study, titanium dioxide (TiO2) was deposited onto a fluorine-doped tin oxide (FTO) substrate using the sol–gel spin coating method. Through the implementation of calcination treatment on the thin film, enhancements were observed in terms of structural, optical, and morphological properties. Various calcination temperatures were explored, with TiO2 annealed at 600 °C identified as the optimal sample. Analysis of the X-ray diffraction spectroscopy (XRD) pattern revealed the prominent orientation plane of (101), indicating the presence of anatase TiO2 with a tetragonal pattern at this temperature. Despite fluctuations in the optical spectrum, the highest transmittance of 80% was observed in the visible region within the wavelength range of 400 nm. The estimated band-gap value of 3.45 eV reaffirmed the characteristic of TiO2. Surface analysis indicated the homogeneous growth of TiO2, uniformly covering the FTO substrate. Cross-sectional examination revealed a thickness of 263 nm with dense and compact nature of TiO2 thin film. No presence of defects or pores reflects a well-organized structure and high-quality formation. Significant electrical rectification properties were observed, indicating the successful formation of a p–n junction. In summary, calcination treatment was found to be crucial for enhancing the properties of the thin film, highlighting its significance in the development of solar cell applications.
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