{"title":"用硬 X 射线角分辨光发射探测氧化镁/铁异质结构的埋藏界面带色散","authors":"Shigenori Ueda, Masaki Mizuguchi","doi":"10.35848/1882-0786/ad5e33","DOIUrl":null,"url":null,"abstract":"\n Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2p -Fe 3d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only bulk band but also buried interface band of heterojunctions.","PeriodicalId":503885,"journal":{"name":"Applied Physics Express","volume":"10 3‐5","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Probing buried interface band dispersion of a MgO/Fe heterostructure with hard X-ray angle-resolved photoemission\",\"authors\":\"Shigenori Ueda, Masaki Mizuguchi\",\"doi\":\"10.35848/1882-0786/ad5e33\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2p -Fe 3d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only bulk band but also buried interface band of heterojunctions.\",\"PeriodicalId\":503885,\"journal\":{\"name\":\"Applied Physics Express\",\"volume\":\"10 3‐5\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-07-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Physics Express\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.35848/1882-0786/ad5e33\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.35848/1882-0786/ad5e33","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
利用硬 X 射线角分辨光发射光谱 (HARPES)，在 3.29 keV 的激发光子能量下，利用 X 射线全反射 (TR) 技术检测了氧化镁（2 nm）/铁（50 nm）异质结构的界面带色散。将 HARPES 在非 TR 条件下获得的埋藏 Fe(001) 的体敏感带色散与 TR-HARPES 获得的近界面敏感 Fe(001) 带色散相减，可以清楚地揭示异界面上 Fe 的带折叠和 O 2p -Fe 3d 杂化。这些结果表明，HARPES 不仅能探测异质结的体带，还能探测异质结的埋藏界面带。
Probing buried interface band dispersion of a MgO/Fe heterostructure with hard X-ray angle-resolved photoemission
Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2p -Fe 3d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only bulk band but also buried interface band of heterojunctions.
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