Dingding Wang, Muhui Jiang, Rui Chang, Yajin Zhou, Hexiang Wang, Baolei Hou, Lei Wu, Xiapu Luo
{"title":"关于寿命终结(EoL)物联网设备不安全性的实证研究","authors":"Dingding Wang, Muhui Jiang, Rui Chang, Yajin Zhou, Hexiang Wang, Baolei Hou, Lei Wu, Xiapu Luo","doi":"10.1109/TDSC.2023.3334017","DOIUrl":null,"url":null,"abstract":"Researchers actively work on the security of Internet of Things (IoT) devices when IoT devices become popular. However, previous works ignore the insecurity about a special category of devices, i.e., the end-of-life (EoL) devices. Once a product becomes EoL, vendors no longer maintain its firmware, which makes it susceptible to attacks. In this article, we conduct the first empirical study to shed light on the (in)security of EoL devices. Our study performs two types of analysis, including the liveness analysis and the vulnerability analysis. The first one aims to detect the scale of EoL devices that are still alive in the wild in the long term. The second one is to evaluate the vulnerabilities existing in (active) EoL devices. We analyzed 894 EoL models from three vendors (i.e., D-Link, Tp-Link, and Netgear) for more than two years. Our study reveals some worrisome facts that were unknown by the community. There exist more than three million active EoL devices, while more than one million of them have been alive for more than five years. Furthermore, more than half of the vulnerabilities are discovered after the EoL date. Although vendors may release security patches after the EoL date, the process is ad hoc and incomplete, with limited functionality. In summary, more than three million active EoL devices are vulnerable, and nearly half of them are threatened by high-risk vulnerabilities. By compromising EoL devices, attackers can achieve a minimum of 8.67 Tbps DDoS attack.","PeriodicalId":13047,"journal":{"name":"IEEE Transactions on Dependable and Secure Computing","volume":null,"pages":null},"PeriodicalIF":7.0000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An Empirical Study on the Insecurity of End-of-Life (EoL) IoT Devices\",\"authors\":\"Dingding Wang, Muhui Jiang, Rui Chang, Yajin Zhou, Hexiang Wang, Baolei Hou, Lei Wu, Xiapu Luo\",\"doi\":\"10.1109/TDSC.2023.3334017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Researchers actively work on the security of Internet of Things (IoT) devices when IoT devices become popular. However, previous works ignore the insecurity about a special category of devices, i.e., the end-of-life (EoL) devices. Once a product becomes EoL, vendors no longer maintain its firmware, which makes it susceptible to attacks. In this article, we conduct the first empirical study to shed light on the (in)security of EoL devices. Our study performs two types of analysis, including the liveness analysis and the vulnerability analysis. The first one aims to detect the scale of EoL devices that are still alive in the wild in the long term. The second one is to evaluate the vulnerabilities existing in (active) EoL devices. We analyzed 894 EoL models from three vendors (i.e., D-Link, Tp-Link, and Netgear) for more than two years. Our study reveals some worrisome facts that were unknown by the community. There exist more than three million active EoL devices, while more than one million of them have been alive for more than five years. Furthermore, more than half of the vulnerabilities are discovered after the EoL date. Although vendors may release security patches after the EoL date, the process is ad hoc and incomplete, with limited functionality. In summary, more than three million active EoL devices are vulnerable, and nearly half of them are threatened by high-risk vulnerabilities. By compromising EoL devices, attackers can achieve a minimum of 8.67 Tbps DDoS attack.\",\"PeriodicalId\":13047,\"journal\":{\"name\":\"IEEE Transactions on Dependable and Secure Computing\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":7.0000,\"publicationDate\":\"2024-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Dependable and Secure Computing\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/TDSC.2023.3334017\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Dependable and Secure Computing","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/TDSC.2023.3334017","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
An Empirical Study on the Insecurity of End-of-Life (EoL) IoT Devices
Researchers actively work on the security of Internet of Things (IoT) devices when IoT devices become popular. However, previous works ignore the insecurity about a special category of devices, i.e., the end-of-life (EoL) devices. Once a product becomes EoL, vendors no longer maintain its firmware, which makes it susceptible to attacks. In this article, we conduct the first empirical study to shed light on the (in)security of EoL devices. Our study performs two types of analysis, including the liveness analysis and the vulnerability analysis. The first one aims to detect the scale of EoL devices that are still alive in the wild in the long term. The second one is to evaluate the vulnerabilities existing in (active) EoL devices. We analyzed 894 EoL models from three vendors (i.e., D-Link, Tp-Link, and Netgear) for more than two years. Our study reveals some worrisome facts that were unknown by the community. There exist more than three million active EoL devices, while more than one million of them have been alive for more than five years. Furthermore, more than half of the vulnerabilities are discovered after the EoL date. Although vendors may release security patches after the EoL date, the process is ad hoc and incomplete, with limited functionality. In summary, more than three million active EoL devices are vulnerable, and nearly half of them are threatened by high-risk vulnerabilities. By compromising EoL devices, attackers can achieve a minimum of 8.67 Tbps DDoS attack.
期刊介绍:
The "IEEE Transactions on Dependable and Secure Computing (TDSC)" is a prestigious journal that publishes high-quality, peer-reviewed research in the field of computer science, specifically targeting the development of dependable and secure computing systems and networks. This journal is dedicated to exploring the fundamental principles, methodologies, and mechanisms that enable the design, modeling, and evaluation of systems that meet the required levels of reliability, security, and performance.
The scope of TDSC includes research on measurement, modeling, and simulation techniques that contribute to the understanding and improvement of system performance under various constraints. It also covers the foundations necessary for the joint evaluation, verification, and design of systems that balance performance, security, and dependability.
By publishing archival research results, TDSC aims to provide a valuable resource for researchers, engineers, and practitioners working in the areas of cybersecurity, fault tolerance, and system reliability. The journal's focus on cutting-edge research ensures that it remains at the forefront of advancements in the field, promoting the development of technologies that are critical for the functioning of modern, complex systems.