范德瓦尔斯异质结构的制造和表征程序

A. F. Shevchun, M. G. Prokudina, S. V. Egorov, E. S. Tikhonov
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引用次数: 0

摘要

摘要 本文逐步介绍了制造各种范德华异质结构的技术。首先,讨论了从层状材料(尤其是石墨和六方氮化硼)中获得单层和少层薄片的过程。然后,根据最终结构的要求,考虑了不同的组装方法。最后,详细介绍了欧姆触点的制作过程,并给出了等离子化学和金属沉积的参数。在不同温度下进行的传输测量发现了场效应,但一些特征,如电荷中性点与零栅极电压之间的强烈偏移、远离电荷中性点的电阻较大以及迁移率较低等,表明所制备器件的质量较差。尽管如此,其中一个制造出的器件还是表现出了良好的质量:最大迁移率估计为 15 000 cm2/(V s),磁场相关性显示了量子霍尔效应,这是高质量石墨烯的标准效应。出乎意料的是,所制备器件的扫描电子显微镜图像显示,片状石墨烯表面存在大量污染,这可能是我们的器件存在相应质量问题的原因。本文介绍了使用化合物和热处理方法清洁薄片的初步结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Procedure for Fabrication and Characterization of van der Waals Heterostructures

A step-by-step description of the technique for manufacturing various van der Waals heterostructures is provided. First, the procedure to obtain monolayer and few-layer flakes from layered materials, in particular graphite and hexagonal boron nitride, is discussed. Next, different approaches to their assembly depending on the required final structure are considered. Finally, the procedure for making ohmic contacts is described in detail and the parameters for plasma chemistry and metal deposition are given. The field effect is discovered in transport measurements carried out at various temperatures, but a number of features, such as a strong shift of the charge neutral point from the zero-gate voltage, a large resistance away from the charge neutral point, and a low mobility, indicate a poor quality of the resulting devices. Nevertheless, one of the fabricated devices demonstrates good quality: the maximum mobility is estimated as 15 000 cm2/(V s), and the magnetic field dependences demonstrate the quantum Hall effect that is standard for high-quality graphene. Unexpectedly, scanning electron microscope images of the resulting devices reveal a large amount of contamination on the surface of the flakes, which may explain the corresponding quality of our devices. Preliminary results of flakes cleaning with chemical compounds and thermal treatment are presented.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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