Kathryn M. Sturge, Noah Hoppis, Ariana M. Bussio, Jonathan Barney, Brian Beaudoin, Cameron Brown, Bruce Carlsten, Carolyn Chun, Bryson C. Clifford, John Cumings, Nicholas Dallmann, Jack Fitzgibbon, Emily H. Frashure, Ashley E. Hammell, José Hannan, Samuel L. Henderson, Miriam E. Hiebert, James Krutzler, Joseph Lichthardt, Mark Marr-Lyon, Thomas Montano, Nathan Moody, Alexander Mueller, Patrick O’Shea, Ryan Schneider, Karl Smith, Bryce Tappan, Clayton Tiemann, David Walter, Timothy W. Koeth
{"title":"电子辐照聚甲基丙烯酸甲酯中高速电树生长的动力学。","authors":"Kathryn M. Sturge, Noah Hoppis, Ariana M. Bussio, Jonathan Barney, Brian Beaudoin, Cameron Brown, Bruce Carlsten, Carolyn Chun, Bryson C. Clifford, John Cumings, Nicholas Dallmann, Jack Fitzgibbon, Emily H. Frashure, Ashley E. Hammell, José Hannan, Samuel L. Henderson, Miriam E. Hiebert, James Krutzler, Joseph Lichthardt, Mark Marr-Lyon, Thomas Montano, Nathan Moody, Alexander Mueller, Patrick O’Shea, Ryan Schneider, Karl Smith, Bryce Tappan, Clayton Tiemann, David Walter, Timothy W. Koeth","doi":"10.1126/science.ado5943","DOIUrl":null,"url":null,"abstract":"<div >Dielectric materials are foundational to our modern-day communications, defense, and commerce needs. Although dielectric breakdown is a primary cause of failure of these systems, we do not fully understand this process. We analyzed the dielectric breakdown channel propagation dynamics of two distinct types of electrical trees. One type of these electrical trees has not been formally classified. We observed the propagation speed of this electrical tree type to exceed 10 million meters per second. These results identify substantial gaps in the understanding of dielectric breakdown, and filling these gaps is paramount to the design and engineering of dielectric materials that are less susceptible to electrostatic discharge failure.</div>","PeriodicalId":21678,"journal":{"name":"Science","volume":null,"pages":null},"PeriodicalIF":44.7000,"publicationDate":"2024-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Dynamics of high-speed electrical tree growth in electron-irradiated polymethyl methacrylate\",\"authors\":\"Kathryn M. Sturge, Noah Hoppis, Ariana M. Bussio, Jonathan Barney, Brian Beaudoin, Cameron Brown, Bruce Carlsten, Carolyn Chun, Bryson C. Clifford, John Cumings, Nicholas Dallmann, Jack Fitzgibbon, Emily H. Frashure, Ashley E. Hammell, José Hannan, Samuel L. Henderson, Miriam E. Hiebert, James Krutzler, Joseph Lichthardt, Mark Marr-Lyon, Thomas Montano, Nathan Moody, Alexander Mueller, Patrick O’Shea, Ryan Schneider, Karl Smith, Bryce Tappan, Clayton Tiemann, David Walter, Timothy W. Koeth\",\"doi\":\"10.1126/science.ado5943\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div >Dielectric materials are foundational to our modern-day communications, defense, and commerce needs. Although dielectric breakdown is a primary cause of failure of these systems, we do not fully understand this process. We analyzed the dielectric breakdown channel propagation dynamics of two distinct types of electrical trees. One type of these electrical trees has not been formally classified. We observed the propagation speed of this electrical tree type to exceed 10 million meters per second. These results identify substantial gaps in the understanding of dielectric breakdown, and filling these gaps is paramount to the design and engineering of dielectric materials that are less susceptible to electrostatic discharge failure.</div>\",\"PeriodicalId\":21678,\"journal\":{\"name\":\"Science\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":44.7000,\"publicationDate\":\"2024-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Science\",\"FirstCategoryId\":\"103\",\"ListUrlMain\":\"https://www.science.org/doi/10.1126/science.ado5943\",\"RegionNum\":1,\"RegionCategory\":\"综合性期刊\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MULTIDISCIPLINARY SCIENCES\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Science","FirstCategoryId":"103","ListUrlMain":"https://www.science.org/doi/10.1126/science.ado5943","RegionNum":1,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MULTIDISCIPLINARY SCIENCES","Score":null,"Total":0}
Dynamics of high-speed electrical tree growth in electron-irradiated polymethyl methacrylate
Dielectric materials are foundational to our modern-day communications, defense, and commerce needs. Although dielectric breakdown is a primary cause of failure of these systems, we do not fully understand this process. We analyzed the dielectric breakdown channel propagation dynamics of two distinct types of electrical trees. One type of these electrical trees has not been formally classified. We observed the propagation speed of this electrical tree type to exceed 10 million meters per second. These results identify substantial gaps in the understanding of dielectric breakdown, and filling these gaps is paramount to the design and engineering of dielectric materials that are less susceptible to electrostatic discharge failure.
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