Runze Zhang, Debashish Sur, Kangming Li, Julia Witt, Robert Black, Alexander Whittingham, John R. Scully, Jason Hattrick-Simpers
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Additionally, we\nposit that the traditional approach to EIS analysis, which often requires\nmeasurements to very low frequencies, might not be always necessary to\ncorrectly model the appropriate ECM. Our study assesses the impact of omitting\ndata from low to medium-frequency ranges on inference results and reveals that\na significant portion of low-frequency measurements can be excluded without\nsubstantially compromising the accuracy of extracting system parameters.\nFurther, we propose simple checks to the posterior distributions of the ECM\ncomponents and posterior predictions, which can be used to quantitatively\nevaluate the suitability of a particular ECM and the minimum frequency required\nto be measured. 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引用次数: 0
摘要
电化学阻抗光谱法(EIS)是评估金属材料腐蚀情况的一项重要技术。对 EIS 的分析取决于选择一个合适的等效电路模型 (ECM),以准确描述所研究系统的特征。在这项工作中,我们系统地研究了三种常用 ECM 在几种典型材料降解情况下的适用性。通过将贝叶斯推理应用于模拟腐蚀 EIS 数据,我们评估了这些 ECM 在不同腐蚀条件下的适用性,并确定了 EIS 数据缺乏足够信息的区域,以便从统计学角度证实 ECM 结构。此外,我们还发现,传统的 EIS 分析方法通常需要测量非常低的频率,但并不总是有必要对适当的 ECM 进行正确建模。我们的研究评估了省略中低频数据对推理结果的影响,结果表明,可以省略相当一部分低频测量,而不会严重影响提取系统参数的准确性。这一框架指出了通过智能减少低频数据收集和允许即时 EIS 测量来加快 EIS 采集的途径
An Assessment of Commonly Used Equivalent Circuit Models for Corrosion Analysis: A Bayesian Approach to Electrochemical Impedance Spectroscopy
Electrochemical Impedance Spectroscopy (EIS) is a crucial technique for
assessing corrosion of a metallic materials. The analysis of EIS hinges on the
selection of an appropriate equivalent circuit model (ECM) that accurately
characterizes the system under study. In this work, we systematically examined
the applicability of three commonly used ECMs across several typical material
degradation scenarios. By applying Bayesian Inference to simulated corrosion
EIS data, we assessed the suitability of these ECMs under different corrosion
conditions and identified regions where the EIS data lacks sufficient
information to statistically substantiate the ECM structure. Additionally, we
posit that the traditional approach to EIS analysis, which often requires
measurements to very low frequencies, might not be always necessary to
correctly model the appropriate ECM. Our study assesses the impact of omitting
data from low to medium-frequency ranges on inference results and reveals that
a significant portion of low-frequency measurements can be excluded without
substantially compromising the accuracy of extracting system parameters.
Further, we propose simple checks to the posterior distributions of the ECM
components and posterior predictions, which can be used to quantitatively
evaluate the suitability of a particular ECM and the minimum frequency required
to be measured. This framework points to a pathway for expediting EIS
acquisition by intelligently reducing low-frequency data collection and
permitting on-the-fly EIS measurements