Sandeep K. Chaudhuri;Ritwik Nag;Utpal N. Roy;Ralph B. James;Krishna C. Mandal
{"title":"电容式弗里施栅 CdZnTeSe 检测器中的高分辨率 γ 射线光谱学","authors":"Sandeep K. Chaudhuri;Ritwik Nag;Utpal N. Roy;Ralph B. James;Krishna C. Mandal","doi":"10.1109/LED.2024.3437230","DOIUrl":null,"url":null,"abstract":"The quaternary semiconductor Cd\n<inline-formula> <tex-math>$_{{0}.{9}}$ </tex-math></inline-formula>\nZn\n<inline-formula> <tex-math>$_{{0}.{1}}$ </tex-math></inline-formula>\n Te\n<inline-formula> <tex-math>$_{\\text {1-{y}}}$ </tex-math></inline-formula>\nSe\n<sub>y</sub>\n (y =0.02–0.03), exhibiting exceptionally high compositional homogeneity and low trap concentrations, has recently emerged as a robust semiconductor crystal for room-temperature detection of gamma-rays. In this letter, we report a high energy resolution of 1.4% achieved for a 3.4 mm \n<inline-formula> <tex-math>$\\times 3.4$ </tex-math></inline-formula>\n mm \n<inline-formula> <tex-math>$\\times 9.7$ </tex-math></inline-formula>\n mm virtual Frisch grid detector when exposed to 662-keV gamma rays, without any digital correction. The above energy resolution was obtained at a fraction of the bias voltage needed to obtain such high energy resolution in most CZTS detectors. A mobility-lifetime product of \n<inline-formula> <tex-math>$4.42\\times 10^{-{3}}$ </tex-math></inline-formula>\n cm\n<sup>2</sup>\n/V and a drift mobility of 882 cm\n<sup>2</sup>\n/V-s for electrons were obtained using a single polarity Hecht plot and the time-of-flight method, respectively. The superior electron transport properties enabled us to calculate the electron-hole pair creation energy (4.47 eV) experimentally for the first time in CZTS. Biparametric correlation studies were performed, which revealed the extraordinary potential of further improvement in the detection performance through digital corrections and can be applied to other wide or ultra-wide bandgap semiconductors.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":null,"pages":null},"PeriodicalIF":4.1000,"publicationDate":"2024-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-Resolution γ -Ray Spectroscopy in Capacitive Frisch Grid CdZnTeSe Detectors\",\"authors\":\"Sandeep K. Chaudhuri;Ritwik Nag;Utpal N. Roy;Ralph B. James;Krishna C. Mandal\",\"doi\":\"10.1109/LED.2024.3437230\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The quaternary semiconductor Cd\\n<inline-formula> <tex-math>$_{{0}.{9}}$ </tex-math></inline-formula>\\nZn\\n<inline-formula> <tex-math>$_{{0}.{1}}$ </tex-math></inline-formula>\\n Te\\n<inline-formula> <tex-math>$_{\\\\text {1-{y}}}$ </tex-math></inline-formula>\\nSe\\n<sub>y</sub>\\n (y =0.02–0.03), exhibiting exceptionally high compositional homogeneity and low trap concentrations, has recently emerged as a robust semiconductor crystal for room-temperature detection of gamma-rays. In this letter, we report a high energy resolution of 1.4% achieved for a 3.4 mm \\n<inline-formula> <tex-math>$\\\\times 3.4$ </tex-math></inline-formula>\\n mm \\n<inline-formula> <tex-math>$\\\\times 9.7$ </tex-math></inline-formula>\\n mm virtual Frisch grid detector when exposed to 662-keV gamma rays, without any digital correction. The above energy resolution was obtained at a fraction of the bias voltage needed to obtain such high energy resolution in most CZTS detectors. A mobility-lifetime product of \\n<inline-formula> <tex-math>$4.42\\\\times 10^{-{3}}$ </tex-math></inline-formula>\\n cm\\n<sup>2</sup>\\n/V and a drift mobility of 882 cm\\n<sup>2</sup>\\n/V-s for electrons were obtained using a single polarity Hecht plot and the time-of-flight method, respectively. The superior electron transport properties enabled us to calculate the electron-hole pair creation energy (4.47 eV) experimentally for the first time in CZTS. Biparametric correlation studies were performed, which revealed the extraordinary potential of further improvement in the detection performance through digital corrections and can be applied to other wide or ultra-wide bandgap semiconductors.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2024-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10620248/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10620248/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
High-Resolution γ -Ray Spectroscopy in Capacitive Frisch Grid CdZnTeSe Detectors
The quaternary semiconductor Cd
$_{{0}.{9}}$
Zn
$_{{0}.{1}}$
Te
$_{\text {1-{y}}}$
Se
y
(y =0.02–0.03), exhibiting exceptionally high compositional homogeneity and low trap concentrations, has recently emerged as a robust semiconductor crystal for room-temperature detection of gamma-rays. In this letter, we report a high energy resolution of 1.4% achieved for a 3.4 mm
$\times 3.4$
mm
$\times 9.7$
mm virtual Frisch grid detector when exposed to 662-keV gamma rays, without any digital correction. The above energy resolution was obtained at a fraction of the bias voltage needed to obtain such high energy resolution in most CZTS detectors. A mobility-lifetime product of
$4.42\times 10^{-{3}}$
cm
2
/V and a drift mobility of 882 cm
2
/V-s for electrons were obtained using a single polarity Hecht plot and the time-of-flight method, respectively. The superior electron transport properties enabled us to calculate the electron-hole pair creation energy (4.47 eV) experimentally for the first time in CZTS. Biparametric correlation studies were performed, which revealed the extraordinary potential of further improvement in the detection performance through digital corrections and can be applied to other wide or ultra-wide bandgap semiconductors.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.