环氧树脂浸渍 REBCO 插入线圈中筛选电流引起的机械损伤和临界电流衰减

Donghui Liu, Wanbo Wei, Yunkai Tang, Dongke Li
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摘要

近年来,人们越来越关注高场高温超导(HTS)磁体中屏蔽电流引起的机械变形。屏蔽电流引起的机械损伤和临界电流衰减已成为 HTS 磁体设计和运行中的重要问题。目前,在数值模拟中既要考虑 REBa2Cu3O7-x (REBCO) 涂层导体 (CC) 的非线性 E-J 幂律关系,又要考虑非线性界面损伤构成关系,是一个具有挑战性的课题。本文针对环氧树脂浸渍的 REBCO 插入线圈提出了一个结合 T-A 公式和内聚区模型 (CZM) 的电动力学模型,并考虑了 REBCO CC 临界电流的机械损伤依赖性。该模型通过实验数据进行了验证。此外,数值结果表明,线圈中的分层和载流性能下降是由高场磁化过程中屏蔽电流产生的巨大电磁力造成的。屏蔽电流对线圈电磁和机械性能的影响在考虑和不考虑 REBCO CC 损伤临界电流的情况下有显著差异。不同的失效模式阐明了导致线圈中 REBCO CC 边缘和内部损坏的基本机制。忽略临界电流衰减的模拟可能会高估线圈的应力、应变和损伤区的增长,同时低估高磁场中的载流衰减。此外,还详细分析了不同背景场下屏蔽电流引起的机械损伤和临界电流衰减。最后,进一步研究了结构参数、线盘、过带和几何位置对线圈分层损伤和载流劣化的影响。这项工作可为高场 HTS 插入磁体的设计和分析提供理论参考。
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Screening-current-induced mechanical damage and critical current degradation in epoxy-impregnated REBCO insert coils
In recent years, there has been growing concern about the mechanical deformation induced by the screening currents in high-field high-temperature superconducting (HTS) magnets. Screening-current-induced mechanical damage and critical current degradation have emerged as significant issues in the design and operation of HTS magnets. Currently, it is a challenging topic to consider both the nonlinear E-J power-law relationship of the REBa2Cu3O7-x (REBCO) coated conductors (CCs) and the nonlinear interface-damaged constitutive relationship in the numerical simulation. This paper presents an electro-mechanical model combining T-A formulation with the cohesive zone model (CZM) for an epoxy-impregnated REBCO insert coil, taking into account the mechanical damage dependence of the critical current of REBCO CCs. The model is validated with experimental data. Additionally, numerical results indicate that delamination and current-carrying degradation in the coil are caused by the large electromagnetic force generated by the screening current during the high-field magnetization process. The effects of screening currents on the electromagnetic and mechanical properties of the coils exhibit a significant difference between scenarios with and without consideration of the damage-dependent critical current of REBCO CCs. The underlying mechanisms leading to edge and internal damage of the REBCO CC in the coil are clarified by different failure modes. Simulations neglecting the degradation of the critical current can overestimate the stress, strain, and damage zone growth of the coil, while underestimating the current-carrying deterioration in the high field. Furthermore, a detailed analysis is conducted on the screening-current-induced mechanical damage and critical current degradation under different background fields. Finally, the influences of the structural parameters, bobbin, overband and geometric position on the delamination damage and current-carrying degradation of the coil are further investigated. This work could provide theoretical references for the design and analysis of high-field HTS insert magnets.
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