{"title":"TCBR 和 TCBD:脆弱图像水印中篡改重合问题的评估指标","authors":"Afrig Aminuddin , Ferda Ernawan , Danakorn Nincarean , Agit Amrullah , Dhani Ariatmanto","doi":"10.1016/j.jestch.2024.101790","DOIUrl":null,"url":null,"abstract":"<div><p>This paper proposed two evaluation metrics of the tamper coincidence in a block map design for image watermarking. These evaluation metrics are called Tamper Coincidence Block Ratio (TCBR) and Tamper Coincidence Block Density (TCBD). A tamper coincidence occurred in image authentication and self-recovery when the recovery data and the original block location were tampered with simultaneously. A high tamper coincidence limits image inpainting’s capability to recover the region, leading to an imprecise recovered image. The ratio and density of the tamper coincidence may significantly affect the final recovered image quality. Previously, researchers mentioned the tamper coincidence in their experiment but did not evaluate it with any metrics. They evaluated the robustness of their technique based on the final recovered image quality using the Peak Signal-to-Noise Ratio (PSNR) and Structural Similarity Index Measure (SSIM). Tamper coincidences are primarily affected by the block map design implemented by the researcher. Thus, TCBR and TCBD provide valuable insight into the block map design’s effectiveness in preventing tamper coincidence. The experimental result shows that the TCBR and TCBD values are inversely proportional to the recovered image quality. A high TCBR and TCBD value leads to low recovered image quality. Therefore, this paper will help the researchers design an effective block map by minimizing the TCBR and TCBD values to obtain the highest recovered image quality.</p></div>","PeriodicalId":48609,"journal":{"name":"Engineering Science and Technology-An International Journal-Jestech","volume":"56 ","pages":"Article 101790"},"PeriodicalIF":5.1000,"publicationDate":"2024-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2215098624001769/pdfft?md5=3cc2c512dbd2ffd1cccb901151f487fd&pid=1-s2.0-S2215098624001769-main.pdf","citationCount":"0","resultStr":"{\"title\":\"TCBR and TCBD: Evaluation metrics for tamper coincidence problem in fragile image watermarking\",\"authors\":\"Afrig Aminuddin , Ferda Ernawan , Danakorn Nincarean , Agit Amrullah , Dhani Ariatmanto\",\"doi\":\"10.1016/j.jestch.2024.101790\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This paper proposed two evaluation metrics of the tamper coincidence in a block map design for image watermarking. These evaluation metrics are called Tamper Coincidence Block Ratio (TCBR) and Tamper Coincidence Block Density (TCBD). A tamper coincidence occurred in image authentication and self-recovery when the recovery data and the original block location were tampered with simultaneously. A high tamper coincidence limits image inpainting’s capability to recover the region, leading to an imprecise recovered image. The ratio and density of the tamper coincidence may significantly affect the final recovered image quality. Previously, researchers mentioned the tamper coincidence in their experiment but did not evaluate it with any metrics. They evaluated the robustness of their technique based on the final recovered image quality using the Peak Signal-to-Noise Ratio (PSNR) and Structural Similarity Index Measure (SSIM). Tamper coincidences are primarily affected by the block map design implemented by the researcher. Thus, TCBR and TCBD provide valuable insight into the block map design’s effectiveness in preventing tamper coincidence. The experimental result shows that the TCBR and TCBD values are inversely proportional to the recovered image quality. A high TCBR and TCBD value leads to low recovered image quality. Therefore, this paper will help the researchers design an effective block map by minimizing the TCBR and TCBD values to obtain the highest recovered image quality.</p></div>\",\"PeriodicalId\":48609,\"journal\":{\"name\":\"Engineering Science and Technology-An International Journal-Jestech\",\"volume\":\"56 \",\"pages\":\"Article 101790\"},\"PeriodicalIF\":5.1000,\"publicationDate\":\"2024-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S2215098624001769/pdfft?md5=3cc2c512dbd2ffd1cccb901151f487fd&pid=1-s2.0-S2215098624001769-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Engineering Science and Technology-An International Journal-Jestech\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S2215098624001769\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Engineering Science and Technology-An International Journal-Jestech","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2215098624001769","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
TCBR and TCBD: Evaluation metrics for tamper coincidence problem in fragile image watermarking
This paper proposed two evaluation metrics of the tamper coincidence in a block map design for image watermarking. These evaluation metrics are called Tamper Coincidence Block Ratio (TCBR) and Tamper Coincidence Block Density (TCBD). A tamper coincidence occurred in image authentication and self-recovery when the recovery data and the original block location were tampered with simultaneously. A high tamper coincidence limits image inpainting’s capability to recover the region, leading to an imprecise recovered image. The ratio and density of the tamper coincidence may significantly affect the final recovered image quality. Previously, researchers mentioned the tamper coincidence in their experiment but did not evaluate it with any metrics. They evaluated the robustness of their technique based on the final recovered image quality using the Peak Signal-to-Noise Ratio (PSNR) and Structural Similarity Index Measure (SSIM). Tamper coincidences are primarily affected by the block map design implemented by the researcher. Thus, TCBR and TCBD provide valuable insight into the block map design’s effectiveness in preventing tamper coincidence. The experimental result shows that the TCBR and TCBD values are inversely proportional to the recovered image quality. A high TCBR and TCBD value leads to low recovered image quality. Therefore, this paper will help the researchers design an effective block map by minimizing the TCBR and TCBD values to obtain the highest recovered image quality.
期刊介绍:
Engineering Science and Technology, an International Journal (JESTECH) (formerly Technology), a peer-reviewed quarterly engineering journal, publishes both theoretical and experimental high quality papers of permanent interest, not previously published in journals, in the field of engineering and applied science which aims to promote the theory and practice of technology and engineering. In addition to peer-reviewed original research papers, the Editorial Board welcomes original research reports, state-of-the-art reviews and communications in the broadly defined field of engineering science and technology.
The scope of JESTECH includes a wide spectrum of subjects including:
-Electrical/Electronics and Computer Engineering (Biomedical Engineering and Instrumentation; Coding, Cryptography, and Information Protection; Communications, Networks, Mobile Computing and Distributed Systems; Compilers and Operating Systems; Computer Architecture, Parallel Processing, and Dependability; Computer Vision and Robotics; Control Theory; Electromagnetic Waves, Microwave Techniques and Antennas; Embedded Systems; Integrated Circuits, VLSI Design, Testing, and CAD; Microelectromechanical Systems; Microelectronics, and Electronic Devices and Circuits; Power, Energy and Energy Conversion Systems; Signal, Image, and Speech Processing)
-Mechanical and Civil Engineering (Automotive Technologies; Biomechanics; Construction Materials; Design and Manufacturing; Dynamics and Control; Energy Generation, Utilization, Conversion, and Storage; Fluid Mechanics and Hydraulics; Heat and Mass Transfer; Micro-Nano Sciences; Renewable and Sustainable Energy Technologies; Robotics and Mechatronics; Solid Mechanics and Structure; Thermal Sciences)
-Metallurgical and Materials Engineering (Advanced Materials Science; Biomaterials; Ceramic and Inorgnanic Materials; Electronic-Magnetic Materials; Energy and Environment; Materials Characterizastion; Metallurgy; Polymers and Nanocomposites)