S Burioli, G Iannone, G De Marzi, D D’Agostino, G Avallone, A Gagno, M Bracco, A Leveratto, A Traverso, D Pedrini, R Valente, M Prioli, P Piccardo, A Malagoli, S Farinon and R Musenich
{"title":"分析热处理前横向变形导致 Nb3Sn 金属丝临界电流衰减实验数据的新型数值方法","authors":"S Burioli, G Iannone, G De Marzi, D D’Agostino, G Avallone, A Gagno, M Bracco, A Leveratto, A Traverso, D Pedrini, R Valente, M Prioli, P Piccardo, A Malagoli, S Farinon and R Musenich","doi":"10.1088/1361-6668/ad68ac","DOIUrl":null,"url":null,"abstract":"In the framework of studies on high-field magnets for future accelerators, a specific project called ASTRACT focuses on the effect of transverse strain on the critical current of Nb3Sn wires. The first phase of the project addresses the effects of strain imposed on Nb3Sn wires before heat treatment and the development of a procedure to directly compare critical current measurements with values extracted from magnetization cycles. A Nb3Sn RRP-Ti wire was deformed to different values of transverse strain (10%, 15%, 20%, and 25%), and long samples were collected for transport measurements at 4.2 K, in a background field ranging from 10 to 14 T. Short samples were used for magnetization measurements (VSM technique). Additionally, SEM images of the cross-section were collected at different longitudinal positions along the wire for each strain value. This paper proposes a method based on SEM image analysis and magnetization measurements analysis to study the effect of bundle deformation on transport properties. The procedure requires morphological information provided by SEM images after appropriate numerical processing. Verification through statistical comparison between the Ic transport and VSM data is also conducted. Direct critical current measurements showed no degradation due to deformation up to 25%. The method introduced, independent of transport data, can reach the same conclusions by considering the real shape of the bundles.","PeriodicalId":21985,"journal":{"name":"Superconductor Science and Technology","volume":"99 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel numerical approach for analyzing experimental data on critical current degradation in Nb3Sn wires caused by transverse deformations preceding heat treatment\",\"authors\":\"S Burioli, G Iannone, G De Marzi, D D’Agostino, G Avallone, A Gagno, M Bracco, A Leveratto, A Traverso, D Pedrini, R Valente, M Prioli, P Piccardo, A Malagoli, S Farinon and R Musenich\",\"doi\":\"10.1088/1361-6668/ad68ac\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the framework of studies on high-field magnets for future accelerators, a specific project called ASTRACT focuses on the effect of transverse strain on the critical current of Nb3Sn wires. 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引用次数: 0
摘要
在未来加速器高磁场磁体研究框架内,一个名为 ASTRACT 的具体项目侧重于横向应变对 Nb3Sn 线临界电流的影响。该项目的第一阶段研究了热处理前施加在铌3硒导线上的应变的影响,并开发了一种程序,可将临界电流测量值与从磁化周期中提取的值直接进行比较。将 Nb3Sn RRP-Ti 金属丝变形到不同的横向应变值(10%、15%、20% 和 25%),并在 4.2 K 和 10 到 14 T 的背景场中采集长样品进行传输测量。此外,针对每个应变值,还在金属丝的不同纵向位置收集了横截面的 SEM 图像。本文提出了一种基于 SEM 图像分析和磁化测量分析的方法,用于研究线束变形对传输特性的影响。该方法需要 SEM 图像提供的形态信息,并经过适当的数值处理。此外,还通过 Ic 传输和 VSM 数据之间的统计比较进行了验证。直接临界电流测量结果表明,变形不超过 25% 不会导致电流下降。所引入的方法独立于传输数据,可通过考虑线束的实际形状得出相同的结论。
A novel numerical approach for analyzing experimental data on critical current degradation in Nb3Sn wires caused by transverse deformations preceding heat treatment
In the framework of studies on high-field magnets for future accelerators, a specific project called ASTRACT focuses on the effect of transverse strain on the critical current of Nb3Sn wires. The first phase of the project addresses the effects of strain imposed on Nb3Sn wires before heat treatment and the development of a procedure to directly compare critical current measurements with values extracted from magnetization cycles. A Nb3Sn RRP-Ti wire was deformed to different values of transverse strain (10%, 15%, 20%, and 25%), and long samples were collected for transport measurements at 4.2 K, in a background field ranging from 10 to 14 T. Short samples were used for magnetization measurements (VSM technique). Additionally, SEM images of the cross-section were collected at different longitudinal positions along the wire for each strain value. This paper proposes a method based on SEM image analysis and magnetization measurements analysis to study the effect of bundle deformation on transport properties. The procedure requires morphological information provided by SEM images after appropriate numerical processing. Verification through statistical comparison between the Ic transport and VSM data is also conducted. Direct critical current measurements showed no degradation due to deformation up to 25%. The method introduced, independent of transport data, can reach the same conclusions by considering the real shape of the bundles.