金属离子注入法制备的局部表面等离子体共振传感器的结构和光学特性:能量和通量的影响

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2024-08-06 DOI:10.1016/j.nimb.2024.165492
Hui Qian , Yimo Wang , Changlong Liu , Jun Wang
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引用次数: 0

摘要

在二氧化硅晶片中分别植入相同能量和不同能量的银离子以及相同能量和不同能量的金离子,制备出 Ag-E30、Ag-E40、Ag-E50、Au-F6.0、Au-F4.5 和 Au-F3.0 样品,作为局域表面等离子体共振传感器的候选样品。对制备的样品的结构和光学特性进行了深入研究。结果表明,在 Ag-E30、Ag-E40 和 Ag-E50 样品中,Ag-E40 样品具有单一的纳米复合表面层,由于粒子间相互作用较强,其特征反射峰的位置与覆盖层的折射率呈线性关系。对于 Au-F6.0、Au-F4.5 和 Au-F3.0 样品,它们都具有单一的纳米复合表面层,并且特征反射峰的位置与覆盖层的折射率呈线性关系。考虑到制备成本,Au-F3.0 样品虽然折射率灵敏度稍低,但应是最佳传感器。
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Structural and optical properties of localized surface plasmon resonance sensor prepared by metal ion implantation: Influences of energy and fluence

The Ag ions with the same fluence and different energies as well as the Au ions with the same energy and different fluences were separately implanted into SiO2 wafers to prepare Ag-E30, Ag-E40, Ag-E50, Au-F6.0, Au-F4.5, and Au-F3.0 samples as the candidates for the localized surface plasmon resonance sensor. The prepared samples' structural and optical properties were studied in depth. The results revealed that among Ag-E30, Ag-E40, and Ag-E50 samples, Ag-E40 sample had a single nanocomposite surface layer, and its characteristic reflection peak linearly depended in position on the refractive index of overlay owing to the stronger interparticle interaction. For Au-F6.0, Au-F4.5, and Au-F3.0 samples, they all featured a single nanocomposite surface layer and showed a linear dependence of the characteristic reflection peak's position and the overlay's refractive index. Considering the cost of preparation, Au-F3.0 sample should be an optimal sensor although its refractive index sensitivity was slightly smaller.

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来源期刊
CiteScore
2.80
自引率
7.70%
发文量
231
审稿时长
1.9 months
期刊介绍: Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.
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