集成主动淬灭电路,用于基于 SPAD 的高速率、无失真时间分辨荧光应用。

Francesco Malanga, Gennaro Fratta, Giulia Acconcia, Ivan Rech
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摘要

时间相关单光子计数(TCSPC)是低照度探测应用中的一项关键技术,以其卓越的灵敏度和带宽而闻名,广泛应用于荧光寿命成像显微镜(FLIM)和量子光学。尽管 TCSPC 功能强大,但在高光子检测率下,其堆积效应可能会扭曲测量结果,从而严重阻碍了其应用。克服堆积效应具有挑战性,传统的解决方案通常涉及复杂的后处理或多通道系统,从而使 TCSPC 设置复杂化并限制了性能。克服这一问题的一个突破是将光电探测器的死区时间与激光周期的整数倍相匹配,这样即使在高照度条件下也能获得不失真直方图。基于这一概念,我们提出了采用 150 纳米高压技术开发的主动淬火电路 (AQC),实现了对单光子雪崩二极管 (SPAD) 死区时间前所未有的控制。我们的设计可补偿工艺、电压和温度(PVT)的变化,确保超精确和稳健的死区时间调整。所推出的 AQC 可实现 50 ps 的死区时间分辨率,适合在 20 至 100 MHz 的可选激光频率范围内进行时间分辨实验,并在死区时间控制中保持接近理想的线性度。通过荧光测量进行的实验验证表明,在计数率较高的条件下,失真度低至 0.43%,这凸显了我们的电路在克服堆积限制方面的功效。
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Integrated Active Quenching Circuit for high-rate and distortionless SPAD-based time-resolved fluorescence applications.

Time-Correlated Single Photon Counting (TCSPC) is a pivotal technique in low-light-detection applications, renowned for its exceptional sensitivity and bandwidth, widely used in Fluorescence Lifetime Imaging Microscopy (FLIM) and quantum optics. Despite its features, TCSPC is significantly hindered by the pile-up effect, which may distort measurements at high photon-detection rates. Overcoming pile-up is challenging, with traditional solutions often involving complex post-processing or multichannel systems, complicating the TCSPC setup and limiting performance. A breakthrough to overcome this issue is matching the photodetector dead time to an integer multiple of the laser period, obtaining a distortionless histogram even at high illumination conditions. Building on this concept, we present an Active Quenching Circuit (AQC) developed in high-voltage 150 nm technology, achieving unprecedented control over the Single Photon Avalanche Diode (SPAD) dead time. Our design compensates for Process, Voltage, and Temperature (PVT) variations, ensuring ultra precise and robust dead time tuning. The presented AQC achieves a dead-time resolution of 50 ps suitable for time-resolved experiments within a selectable range of laser frequencies from 20 to 100 MHz, maintaining close-to- ideal linearity in dead-time control. Experimental validations through fluorescence measurements reveal a distortion as low as 0.43% under elevated count-rate conditions, highlighting the efficacy of our circuit in overcoming the pile-up limitation.

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