轻松提取扫描探针形状,改善针尖-样品相互作用伪影的解卷积效果

IF 4.7 Q2 NANOSCIENCE & NANOTECHNOLOGY Micro and Nano Systems Letters Pub Date : 2024-08-24 DOI:10.1186/s40486-024-00207-z
Kibum Jung, Jungchul Lee
{"title":"轻松提取扫描探针形状,改善针尖-样品相互作用伪影的解卷积效果","authors":"Kibum Jung,&nbsp;Jungchul Lee","doi":"10.1186/s40486-024-00207-z","DOIUrl":null,"url":null,"abstract":"<div><p>Atomic Force Microscopy (AFM) has intrinsic tip-sample convolution artifacts. Commercially available tip-check samples are used to obtain only the tip radius, which can be used to deconvolute surface profiles or to quantify tip wear by relying on AFM alone. When the sample height is of the order of 100 nm or more, not only the tip radius but also the overall tip shape plays a key role in imaging. Therefore, it is necessary to know the overall tip shape, which requires a structured sample that is much larger than tip-check samples. Here, we propose to use deep reactive ion-etched holes of 1 µ diameter and 5 µ height to reconstruct the overall tip shape of three different AFM probes, namely conical, pyramidal and tetrahedral. The proposed cylindrical hole structure seems promising, as simple inversion of AFM images can provide sufficient collective features to be used for deconvolution and image enhancement.</p></div>","PeriodicalId":704,"journal":{"name":"Micro and Nano Systems Letters","volume":"12 1","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://mnsl-journal.springeropen.com/counter/pdf/10.1186/s40486-024-00207-z","citationCount":"0","resultStr":"{\"title\":\"Facile extraction of scanning probe shape for improved deconvolution of tip-sample interaction artifacts\",\"authors\":\"Kibum Jung,&nbsp;Jungchul Lee\",\"doi\":\"10.1186/s40486-024-00207-z\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Atomic Force Microscopy (AFM) has intrinsic tip-sample convolution artifacts. Commercially available tip-check samples are used to obtain only the tip radius, which can be used to deconvolute surface profiles or to quantify tip wear by relying on AFM alone. When the sample height is of the order of 100 nm or more, not only the tip radius but also the overall tip shape plays a key role in imaging. Therefore, it is necessary to know the overall tip shape, which requires a structured sample that is much larger than tip-check samples. Here, we propose to use deep reactive ion-etched holes of 1 µ diameter and 5 µ height to reconstruct the overall tip shape of three different AFM probes, namely conical, pyramidal and tetrahedral. The proposed cylindrical hole structure seems promising, as simple inversion of AFM images can provide sufficient collective features to be used for deconvolution and image enhancement.</p></div>\",\"PeriodicalId\":704,\"journal\":{\"name\":\"Micro and Nano Systems Letters\",\"volume\":\"12 1\",\"pages\":\"\"},\"PeriodicalIF\":4.7000,\"publicationDate\":\"2024-08-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://mnsl-journal.springeropen.com/counter/pdf/10.1186/s40486-024-00207-z\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Micro and Nano Systems Letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1186/s40486-024-00207-z\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"NANOSCIENCE & NANOTECHNOLOGY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micro and Nano Systems Letters","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1186/s40486-024-00207-z","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"NANOSCIENCE & NANOTECHNOLOGY","Score":null,"Total":0}
引用次数: 0

摘要

原子力显微镜(AFM)具有固有的针尖-样品卷积伪影。市场上出售的针尖检查样品只能获得针尖半径,而针尖半径可用于解卷积表面轮廓,或仅靠原子力显微镜量化针尖磨损。当样品高度达到或超过 100 nm 时,在成像中起关键作用的不仅是针尖半径,还有针尖的整体形状。因此,有必要了解针尖的整体形状,这就需要一个比针尖检查样本大得多的结构化样本。在此,我们建议使用直径为 1 µ、高度为 5 µ 的深反应离子蚀刻孔来重建三种不同 AFM 探针(即圆锥形、金字塔形和四面体形)的整体针尖形状。提议的圆柱孔结构似乎很有前景,因为 AFM 图像的简单反转就能提供足够的集合特征,用于解卷积和图像增强。
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Facile extraction of scanning probe shape for improved deconvolution of tip-sample interaction artifacts

Atomic Force Microscopy (AFM) has intrinsic tip-sample convolution artifacts. Commercially available tip-check samples are used to obtain only the tip radius, which can be used to deconvolute surface profiles or to quantify tip wear by relying on AFM alone. When the sample height is of the order of 100 nm or more, not only the tip radius but also the overall tip shape plays a key role in imaging. Therefore, it is necessary to know the overall tip shape, which requires a structured sample that is much larger than tip-check samples. Here, we propose to use deep reactive ion-etched holes of 1 µ diameter and 5 µ height to reconstruct the overall tip shape of three different AFM probes, namely conical, pyramidal and tetrahedral. The proposed cylindrical hole structure seems promising, as simple inversion of AFM images can provide sufficient collective features to be used for deconvolution and image enhancement.

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来源期刊
Micro and Nano Systems Letters
Micro and Nano Systems Letters Engineering-Biomedical Engineering
CiteScore
10.60
自引率
5.60%
发文量
16
审稿时长
13 weeks
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