通过基于深度学习的数字图像相关技术纠正微电子封装结构翘曲测量中的热气流失真。

IF 7.3 1区 工程技术 Q1 INSTRUMENTS & INSTRUMENTATION Microsystems & Nanoengineering Pub Date : 2024-08-26 DOI:10.1038/s41378-024-00764-8
Yuhan Gao, Yuxin Chen, Ziniu Yu, Chuanguo Xiong, Xin Lei, Weishan Lv, Sheng Liu, Fulong Zhu
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摘要

基于投影斑点的三维数字图像相关方法(3D-DIC)因其非侵入性、高精度和低成本的特点,正越来越多地应用于微电子封装结构的可靠性测量。然而,在测量封装结构的热可靠性时,加热产生的热气流会使 DIC 测量系统捕获的图像失真,从而影响非接触测量的准确性和可靠性。为了应对这一挑战,我们提出了一种基于变压器注意机制的热气流畸变校正模型,专门用于测量微电子封装结构的热翘曲。该模型避免了卷积神经网络中的过平滑问题和生成对抗网络中缺乏物理约束的问题,确保了斑点模式中灰度梯度变化的精度,并最大限度地降低了对 DIC 计算精度的不利影响。通过将 DIC 测量系统捕获的扭曲图像输入网络,可获得用于 3D-DIC 计算的校正图像,从而获得样品的热翘曲测量结果。通过使用定制的阶梯块试样测量形貌的实验,证实了所提出的方法在提高翘曲测量精度方面的有效性;尤其是当捕捉到的图像受到 140 ℃ 和 160 ℃ 温度下热气流的影响时(这是包装结构热可靠性测试中经常遇到的温度)。该方法成功地将标准偏差分别从 9.829 微米和 12.318 微米降低到 5.943 微米和 6.418 微米。结果表明,这种测量微电子封装结构热翘曲的方法具有很大的实用价值。
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Correction of thermal airflow distortion in warpage measurements of microelectronic packaging structures via deep learning-based digital image correlation.

The projected speckle-based three-dimensional digital image correlation method (3D-DIC) is being increasingly used in the reliability measurement of microelectronic packaging structures because of its noninvasive nature, high precision, and low cost. However, during the measurement of the thermal reliability of packaging structures, the thermal airflow generated by heating introduces distortions in the images captured by the DIC measurement system, impacting the accuracy and reliability of noncontact measurements. To address this challenge, a thermal airflow distortion correction model based on the transformer attention mechanism is proposed specifically for the measurement of thermal warpage in microelectronic packaging structures. This model avoids the oversmoothing issue associated with convolutional neural networks and the lack of physical constraints in generative adversarial networks, ensuring the precision of grayscale gradient changes in speckle patterns and minimizing adverse effects on DIC calculation accuracy. By inputting the distorted images captured by the DIC measurement system into the network, corrected images are obtained for 3D-DIC calculations, thus allowing the thermal warpage measurement results of the sample to be acquired. Through experiments measuring topography with customized step block specimens, the effectiveness of the proposed method in improving warpage measurement accuracy is confirmed; this is particularly true when captured images are affected by thermal airflow at 140 °C and 160 °C, temperatures commonly encountered in thermal reliability testing of packaging structures. The method successfully reduces the standard deviation from 9.829 to 5.943 µm and from 12.318 to 6.418 µm, respectively. The results demonstrate the substantial practical value of this method for measuring thermal warpage in microelectronic packaging structures.

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来源期刊
Microsystems & Nanoengineering
Microsystems & Nanoengineering Materials Science-Materials Science (miscellaneous)
CiteScore
12.00
自引率
3.80%
发文量
123
审稿时长
20 weeks
期刊介绍: Microsystems & Nanoengineering is a comprehensive online journal that focuses on the field of Micro and Nano Electro Mechanical Systems (MEMS and NEMS). It provides a platform for researchers to share their original research findings and review articles in this area. The journal covers a wide range of topics, from fundamental research to practical applications. Published by Springer Nature, in collaboration with the Aerospace Information Research Institute, Chinese Academy of Sciences, and with the support of the State Key Laboratory of Transducer Technology, it is an esteemed publication in the field. As an open access journal, it offers free access to its content, allowing readers from around the world to benefit from the latest developments in MEMS and NEMS.
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