Improving the estimation accuracy of wheat maturity date by coupling WheatGrow with satellite images

Accurate estimation of wheat maturity date (MD) is helpful to make reasonable harvest planning and guarantee crop yield and quality. In this study, wheat phenology extracted from satellite images was assimilated into WheatGrow model to develop wheat maturity date estimation model. Theoretical uncertainty was introduced into assimilation system as the error covariance matrix of remote sensing observations, which improved the performance of maturity date estimation model. Compared with the simulated maturity date of crop growth model and assimilation system combined with the constant uncertainty (Assimilation1), the accuracy of assimilation system combined with the theoretical uncertainty (Assimilation2) was higher (r = 0.81, RMSE = 4.5 d). Assimilation2 has better performance and robustness in different years and different subregions. The mean relative errors between the estimated values of Assimilation2 and the observations were generally small and concentrated in the range of −5 % to 5 %. The estimated maturity date showed latitude variation in spatial distribution in the Huang-Huai-Hai Plain (HHHP). In addition, the trend of wheat maturity date from 2001 to 2020 in the central region of HHHP was significant (p < 0.05), and the mean change rate of maturity date reached 3–6 d/10a. However, the overall change trend of maturity date in the HHHP was not significant. Temperature was main driver affecting the spatiotemporal variation of wheat maturity date. The regional wheat maturity date estimation model can provide technical support for wheat maturity date estimation at regional scale.