{"title":"更正 \"FIB-SEM 图像的质量评估\"。","authors":"","doi":"10.1111/jmi.13355","DOIUrl":null,"url":null,"abstract":"<p>Roldan, D., Redenbach, C., Schladitz, K., Kübel, C., & Schlabach, S. (2024). Image quality evaluation for FIB-SEM images. <i>Journal of Microscopy</i>, <i>293</i>(2), 98-117. https://onlinelibrary.wiley.com/doi/10.1111/jmi.13254</p><p>Diego Roldan's affiliation appears as “National University, Bogotá, Colombia”</p><p>The correct affiliation is “Departamento de Matemáticas, Universidad Nacional de Colombia, Bogotá, Colombia”</p><p>We apologise for this error.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"296 1","pages":"108"},"PeriodicalIF":1.5000,"publicationDate":"2024-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1111/jmi.13355","citationCount":"0","resultStr":"{\"title\":\"Correction to “Image quality evaluation for FIB-SEM images”\",\"authors\":\"\",\"doi\":\"10.1111/jmi.13355\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Roldan, D., Redenbach, C., Schladitz, K., Kübel, C., & Schlabach, S. (2024). Image quality evaluation for FIB-SEM images. <i>Journal of Microscopy</i>, <i>293</i>(2), 98-117. https://onlinelibrary.wiley.com/doi/10.1111/jmi.13254</p><p>Diego Roldan's affiliation appears as “National University, Bogotá, Colombia”</p><p>The correct affiliation is “Departamento de Matemáticas, Universidad Nacional de Colombia, Bogotá, Colombia”</p><p>We apologise for this error.</p>\",\"PeriodicalId\":16484,\"journal\":{\"name\":\"Journal of microscopy\",\"volume\":\"296 1\",\"pages\":\"108\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2024-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.1111/jmi.13355\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of microscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1111/jmi.13355\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of microscopy","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1111/jmi.13355","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0
摘要
Roldan, D., Redenbach, C., Schladitz, K., Kübel, C., & Schlabach, S. (2024)。FIB-SEM 图像的质量评估。Journal of Microscopy, 293(2), 98-117。https://onlinelibrary.wiley.com/doi/10.1111/jmi.13254Diego Roldan 的单位显示为 "National University, Bogotá, Colombia",正确的单位是 "Departamento de Matemáticas, Universidad Nacional de Colombia, Bogotá, Colombia",我们对这一错误表示歉意。
Correction to “Image quality evaluation for FIB-SEM images”
Roldan, D., Redenbach, C., Schladitz, K., Kübel, C., & Schlabach, S. (2024). Image quality evaluation for FIB-SEM images. Journal of Microscopy, 293(2), 98-117. https://onlinelibrary.wiley.com/doi/10.1111/jmi.13254
Diego Roldan's affiliation appears as “National University, Bogotá, Colombia”
The correct affiliation is “Departamento de Matemáticas, Universidad Nacional de Colombia, Bogotá, Colombia”
期刊介绍:
The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit.
The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens.
Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.