{"title":"优化基于二氧化硅和二氧化钛的超材料:形态、结构和光学表征","authors":"","doi":"10.1016/j.optmat.2024.116038","DOIUrl":null,"url":null,"abstract":"<div><p>In recent years, metamaterials have emerged as a crucial technology for designing sub-wavelength thick optical components capable of performing various optical functions. Among the others, these nanostructures could be employed to tune the refractive index, making them useful in various fields (from optoelectronic applications to gravitational wave detectors). In this work, nanostratified structures composed of alternating layers of silica (SiO<sub>2</sub>) and titania (TiO<sub>2</sub>) were proposed and fabricated using plasma-assisted electron beam deposition. The quality of the deposition was demonstrated using Scanning Transmission Electron Microscopy (STEM), revealing 38 titania/silica doublets with a total thickness compatible with the nominal one of 125.4 nm. X-ray Reflectivity (XRR) and Spectroscopic Ellipsometry (SE) confirmed that the average thicknesses of the titania and silica layers are in good agreement with the expected nominal values even after annealing at 500 °C. Finally, Atomic Force Microscopy (AFM) revealed a very flat surface, both in the as-deposited sample and in the thermally processed one.</p></div>","PeriodicalId":19564,"journal":{"name":"Optical Materials","volume":null,"pages":null},"PeriodicalIF":3.8000,"publicationDate":"2024-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0925346724012217/pdfft?md5=7464462758e27b78bdf207c4ec9e931f&pid=1-s2.0-S0925346724012217-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Toward the optimization of SiO2 and TiO2-based metamaterials: Morphological, Structural, and Optical characterization\",\"authors\":\"\",\"doi\":\"10.1016/j.optmat.2024.116038\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>In recent years, metamaterials have emerged as a crucial technology for designing sub-wavelength thick optical components capable of performing various optical functions. Among the others, these nanostructures could be employed to tune the refractive index, making them useful in various fields (from optoelectronic applications to gravitational wave detectors). In this work, nanostratified structures composed of alternating layers of silica (SiO<sub>2</sub>) and titania (TiO<sub>2</sub>) were proposed and fabricated using plasma-assisted electron beam deposition. The quality of the deposition was demonstrated using Scanning Transmission Electron Microscopy (STEM), revealing 38 titania/silica doublets with a total thickness compatible with the nominal one of 125.4 nm. X-ray Reflectivity (XRR) and Spectroscopic Ellipsometry (SE) confirmed that the average thicknesses of the titania and silica layers are in good agreement with the expected nominal values even after annealing at 500 °C. Finally, Atomic Force Microscopy (AFM) revealed a very flat surface, both in the as-deposited sample and in the thermally processed one.</p></div>\",\"PeriodicalId\":19564,\"journal\":{\"name\":\"Optical Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.8000,\"publicationDate\":\"2024-09-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S0925346724012217/pdfft?md5=7464462758e27b78bdf207c4ec9e931f&pid=1-s2.0-S0925346724012217-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Materials\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0925346724012217\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Materials","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0925346724012217","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
摘要
近年来,超材料已成为设计能够实现各种光学功能的亚波长厚光学元件的关键技术。其中,这些纳米结构可用于调节折射率,使其在各个领域(从光电应用到引力波探测器)都有用武之地。在这项工作中,我们提出了由二氧化硅(SiO2)和二氧化钛(TiO2)交替层组成的纳米层状结构,并利用等离子体辅助电子束沉积制造了这种结构。使用扫描透射电子显微镜(STEM)证明了沉积的质量,显示出 38 个二氧化钛/二氧化硅双层,总厚度与标称厚度 125.4 纳米相符。X 射线反射率(XRR)和光谱椭偏仪(SE)证实,即使在 500 °C 退火后,二氧化钛和二氧化硅层的平均厚度也与预期的标称值非常一致。最后,原子力显微镜(AFM)显示,无论是淀积样品还是热处理样品,表面都非常平整。
Toward the optimization of SiO2 and TiO2-based metamaterials: Morphological, Structural, and Optical characterization
In recent years, metamaterials have emerged as a crucial technology for designing sub-wavelength thick optical components capable of performing various optical functions. Among the others, these nanostructures could be employed to tune the refractive index, making them useful in various fields (from optoelectronic applications to gravitational wave detectors). In this work, nanostratified structures composed of alternating layers of silica (SiO2) and titania (TiO2) were proposed and fabricated using plasma-assisted electron beam deposition. The quality of the deposition was demonstrated using Scanning Transmission Electron Microscopy (STEM), revealing 38 titania/silica doublets with a total thickness compatible with the nominal one of 125.4 nm. X-ray Reflectivity (XRR) and Spectroscopic Ellipsometry (SE) confirmed that the average thicknesses of the titania and silica layers are in good agreement with the expected nominal values even after annealing at 500 °C. Finally, Atomic Force Microscopy (AFM) revealed a very flat surface, both in the as-deposited sample and in the thermally processed one.
期刊介绍:
Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials.
OPTICAL MATERIALS focuses on:
• Optical Properties of Material Systems;
• The Materials Aspects of Optical Phenomena;
• The Materials Aspects of Devices and Applications.
Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.