用于快速横截面成像的 A 扫描荧光显微镜

IF 3.5 2区 物理与天体物理 Q2 PHYSICS, APPLIED Applied Physics Letters Pub Date : 2024-09-09 DOI:10.1063/5.0215650
Varun Kumar, Yao Tian, David L. Becker, Quan Liu
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引用次数: 0

摘要

本文介绍了一种显微镜技术,它能以与超声波成像和光学相干断层扫描中的 A 扫描相同的方式进行快照深度分辨光学成像。在这项技术中,激光线沿轴向照射样品,形成荧光线状物体。通过使用全锥反射镜将沿轴向(Z)的线状物体转换为横向(X-Y)的环状图像,可以使用普通光学技术精确地传递和获取环状图像。然后,通过使用半锥反射镜将环形图像的一半转换回线形图像,半锥反射镜的开口面允许在一次快照中拍摄包含线形物体全部深度分辨信息的线形图像。这消除了共聚焦显微镜等传统深度分辨成像技术为获得相同信息而进行轴向扫描的要求。该技术通过对不同直径的荧光微球成像进行了演示。该技术为共聚焦显微镜和光片显微镜等传统深度分辨成像技术提供了一种简单的替代方法。它尤其适用于多层样品的成像,其中多个 A 扫描或几个 B 扫描就足以代表整个样品。
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A-scan fluorescence microscopy for rapid cross-sectional imaging
This paper presents a microscopy technique that can perform snapshot depth resolved optical imaging in the same manner as A-scan in ultrasound imaging and optical coherence tomography. In this technique, a laser line along the axial dimension is used to illuminate a sample to create a fluorescent line object. By transforming the line object along the axial dimension (Z) to a ring image on the lateral dimensions (X-Y) using a full cone mirror, common optics can be used to relay and acquire the ring image precisely. Then, by converting half of the ring image back to a line image using a half cone mirror, the opening side of the half cone mirror allows the line image, which contains the full depth resolved information of the line object, to be taken in one snapshot. This eliminates the requirement of axial scanning in traditional depth resolved imaging techniques such as confocal microscopy to obtain the same information. The technique is demonstrated by imaging fluorescent microspheres of different diameters. This technique offers a simple alternative to traditional depth resolved imaging techniques such as confocal microscopy and light sheet microscopy. It is particularly useful in imaging samples with multiple layers in which multiple A-scans or a few B-scans are sufficient to represent the entire sample.
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来源期刊
Applied Physics Letters
Applied Physics Letters 物理-物理:应用
CiteScore
6.40
自引率
10.00%
发文量
1821
审稿时长
1.6 months
期刊介绍: Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology. In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics. APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field. Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.
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