将缺陷诱导掺杂 Ce 的 SrTiO3 作为 IT-SOFC 应用中的固体电解质的结构、微观结构和电性能研究

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-09-05 DOI:10.1007/s11664-024-11392-3
Vedika Yadav, Upendra Kumar
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引用次数: 0

摘要

通过高温传统陶瓷路线合成了 SrTi1-xCexO3 (x = 0、0.02 和 0.04)离子导体,并分析了它们在中温固体氧化物燃料电池(IT-SOFC)中用作固体电解质的电学特性。扫描电子显微镜/能量色散 X 射线光谱法(SEM-EDX)用于分析样品的成分均匀性和形态。利用 X 射线衍射 (XRD) 进行了相分析,然后进行了里特维尔德细化,确认了空间群为立方晶体结构。拉曼光谱中 462 cm-1 和 449 cm-1 处的波段证实了在 SrTiO3 的 Ti 位上掺入了 Ce。在 X 射线光电子能谱(XPS)分析中,ZETA 电位分析发现了负电荷的存在,支持了 Ce4+ 位点上 Ce3+ 的存在,用 \(C{e}_{C{e}^{4+}}^{3+}{^\prime}\ 表示;Ti4+ 位点上 Ti3+ 的存在,用 \(T{i}_{T{i}^{4+}}^{3+}{^\prime}\ 表示。样品的总电导率表现出两种不同活化能值的热依赖性阿伦尼乌斯行为。高温区的活化能(\ge 1 \text{eV}\)表明了双电离氧空位的迁移,而(\le 0.50 \text{eV}\)则反映了电子在 Ti4+/Ce4+ 的退化位点之间的迁移。阻抗光谱研究表明,在电学特性中存在块体贡献,而且类似的电荷载流子对这两个过程都负有责任。氧空位对电导的影响也得到了磁性能的支持,在掺杂 Ce 时,磁性能显示出从二磁性到顺磁性的相变。在 610°C 时,总电导率的最高值约为 0.003 S cm-1,使其成为 IT-SOFC 应用中固体电解质的潜在候选材料。
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Study of the Structure, Microstructure, and Electrical Properties of Defect-Induced Ce-Doped SrTiO3 as Solid Electrolyte in IT-SOFC Application

Ionic conductors with the composition SrTi1−xCexO3 (x = 0, 0.02, and 0.04) were synthesized by a high-temperature conventional ceramic route, and their electrical properties were analyzed for use as solid electrolytes in intermediate-temperature solid oxide fuel cells (IT-SOFCs). Scanning electron microscopy/energy-dispersive x-ray spectroscopy (SEM-EDX) was used to analyze the compositional homogeneity and morphology of the samples. The phase analysis was performed using X-ray diffraction (XRD), followed by Rietveld refinement, confirming the cubic crystal structure under the space group \(Pm\overline{3 }m\). The bands at 462 cm−1 and 449 cm−1 in the Raman spectrum confirmed the incorporation of Ce at the Ti-site of SrTiO3. The presence of a negative charge was found from zeta potential analysis, supporting the presence of Ce3+ at the Ce4+site, denoted by \(C{e}_{C{e}^{4+}}^{3+}{^\prime}\), and Ti3+ at the Ti4+ site, denoted by \(T{i}_{T{i}^{4+}}^{3+}{^\prime}\), in X-ray photoelectron spectroscopy (XPS) analysis. The total conductivity of samples showed thermal-dependent Arrhenius behavior with two different activation energy values. The activation energy \(\ge 1 \text{eV}\) in high-temperature regions indicated the migration of doubly ionized oxygen vacancy and \(\le 0.50 \text{eV}\) reflecting the migration of electrons between the degenerate sites of Ti4+/Ce4+. The impedance spectroscopy studies suggested the presence of bulk contribution in the electrical properties, and similar charge carriers were responsible for both processes. The impact of oxygen vacancy on electrical conduction was also supported by the magnetic properties, which displayed diamagnetic to paramagnetic phase transition with Ce doping. The highest value of total conductivity was obtained around 0.003 S cm−1 at 610°C, making it a potential candidate for solid electrolytes in IT-SOFC applications.

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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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