{"title":"6063 铝合金上的钼/钛/硒导电转换涂层的制备与性能","authors":"Aihua Yi, Min Liu, Wenfang Li, Yuying Liu, Yeping Mo, Zhiquan Huang, Xiaolan Chen","doi":"10.1002/sia.7352","DOIUrl":null,"url":null,"abstract":"Conductivity chromium‐free conversion coatings on aluminum substrates were achieved by utilizing Na<jats:sub>2</jats:sub>SnO<jats:sub>3</jats:sub> and Mo/Ti solutions. The composition and morphology of the coatings were characterized using XPS, SEM, EDS, AFM, and Raman spectroscopies. The corrosion behavior of the coatings in 3.5‐wt% NaCl solution was investigated through a dynamic potential polarization method and EIS analysis. Mott–Schottky and UV–Vis analyses were used to determine the semiconductor properties of the coatings, including carrier concentration and band gap. The results revealed that the main components of the coating were Al<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub>, SnO<jats:sub>2</jats:sub>, MoO<jats:sub>3</jats:sub>, and MoO<jats:sub>2</jats:sub> and the coating presented a double‐layer structure, including a transition layer close to the substrate and a compact layer on the surface. The coating also exhibited the properties of a p‐type semiconductor. The electrical contact resistance value of adding Na<jats:sub>2</jats:sub>SnO<jats:sub>3</jats:sub> decreased from 0.4331 to 0.1343 Ω/in<jats:sup>2</jats:sup> (in 200 psi), while the band gap decreased from 2.281 to 2.232 eV.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2024-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Preparation and Properties of Mo/Ti/Sn Conductivity Conversion Coatings on 6063 Aluminum Alloy\",\"authors\":\"Aihua Yi, Min Liu, Wenfang Li, Yuying Liu, Yeping Mo, Zhiquan Huang, Xiaolan Chen\",\"doi\":\"10.1002/sia.7352\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Conductivity chromium‐free conversion coatings on aluminum substrates were achieved by utilizing Na<jats:sub>2</jats:sub>SnO<jats:sub>3</jats:sub> and Mo/Ti solutions. The composition and morphology of the coatings were characterized using XPS, SEM, EDS, AFM, and Raman spectroscopies. The corrosion behavior of the coatings in 3.5‐wt% NaCl solution was investigated through a dynamic potential polarization method and EIS analysis. Mott–Schottky and UV–Vis analyses were used to determine the semiconductor properties of the coatings, including carrier concentration and band gap. The results revealed that the main components of the coating were Al<jats:sub>2</jats:sub>O<jats:sub>3</jats:sub>, SnO<jats:sub>2</jats:sub>, MoO<jats:sub>3</jats:sub>, and MoO<jats:sub>2</jats:sub> and the coating presented a double‐layer structure, including a transition layer close to the substrate and a compact layer on the surface. The coating also exhibited the properties of a p‐type semiconductor. The electrical contact resistance value of adding Na<jats:sub>2</jats:sub>SnO<jats:sub>3</jats:sub> decreased from 0.4331 to 0.1343 Ω/in<jats:sup>2</jats:sup> (in 200 psi), while the band gap decreased from 2.281 to 2.232 eV.\",\"PeriodicalId\":22062,\"journal\":{\"name\":\"Surface and Interface Analysis\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2024-09-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Surface and Interface Analysis\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1002/sia.7352\",\"RegionNum\":4,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface and Interface Analysis","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1002/sia.7352","RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
Preparation and Properties of Mo/Ti/Sn Conductivity Conversion Coatings on 6063 Aluminum Alloy
Conductivity chromium‐free conversion coatings on aluminum substrates were achieved by utilizing Na2SnO3 and Mo/Ti solutions. The composition and morphology of the coatings were characterized using XPS, SEM, EDS, AFM, and Raman spectroscopies. The corrosion behavior of the coatings in 3.5‐wt% NaCl solution was investigated through a dynamic potential polarization method and EIS analysis. Mott–Schottky and UV–Vis analyses were used to determine the semiconductor properties of the coatings, including carrier concentration and band gap. The results revealed that the main components of the coating were Al2O3, SnO2, MoO3, and MoO2 and the coating presented a double‐layer structure, including a transition layer close to the substrate and a compact layer on the surface. The coating also exhibited the properties of a p‐type semiconductor. The electrical contact resistance value of adding Na2SnO3 decreased from 0.4331 to 0.1343 Ω/in2 (in 200 psi), while the band gap decreased from 2.281 to 2.232 eV.
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Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).
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