Chiranjit Debnath;Sujan Kar;Ashish K. Agrawal;Mayank Shukla;Sunil Verma
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The device relevant properties of the synthesized TSB/PMMA plastic scintillator, important for their deployment in optical imaging applications, such as the index of refraction, UV-Vis–NIR transmission, and photoluminescence (PL) properties, have been characterized as a function of TSB concentration in the polymer matrix and the behavior observed has been analyzed. Thin wafers of 0.5 mm thickness having different TSB concentrations were fabricated and used for demonstrating X-ray imaging with a resolution of \n<inline-formula> <tex-math>$100~\\mu $ </tex-math></inline-formula>\nm, using X-ray imaging beamline of Indus-2 synchrotron radiation facility. In addition, the samples of 5 mm thickness having two different concentrations were used for the detection of neutrons using thermal neutron beamline of Dhruva research reactor facility at Bhabha Atomic Research Centre (BARC), Trombay. 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To fulfil the requirement of large area scintillator detector elements, trans-stilbene/poly(methyl methacrylate) (TSB/PMMA) composites have been developed. These plastic scintillator materials can be prepared in a relatively simpler manner as compared to the single crystals. The detailed optimization of the synthesis parameters has been reported. Using the optimal parameters, the TSB/PMMA composites having different TSB concentrations, up to a maximum of 35 wt% TSB, have been successfully fabricated. The fabricated composites were stable at room temperature, optically homogeneous, and transparent in a wide spectral range. The device relevant properties of the synthesized TSB/PMMA plastic scintillator, important for their deployment in optical imaging applications, such as the index of refraction, UV-Vis–NIR transmission, and photoluminescence (PL) properties, have been characterized as a function of TSB concentration in the polymer matrix and the behavior observed has been analyzed. Thin wafers of 0.5 mm thickness having different TSB concentrations were fabricated and used for demonstrating X-ray imaging with a resolution of \\n<inline-formula> <tex-math>$100~\\\\mu $ </tex-math></inline-formula>\\nm, using X-ray imaging beamline of Indus-2 synchrotron radiation facility. In addition, the samples of 5 mm thickness having two different concentrations were used for the detection of neutrons using thermal neutron beamline of Dhruva research reactor facility at Bhabha Atomic Research Centre (BARC), Trombay. 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引用次数: 0
摘要
反式二苯乙烯(TSB)晶体对于通过闪烁过程探测高能光子和中子非常重要。为了满足大面积闪烁探测器元件的要求,人们开发了反式苯乙烯/聚甲基丙烯酸甲酯(TSB/PMMA)复合材料。与单晶体相比,这些塑料闪烁体材料的制备方法相对简单。报告详细介绍了合成参数的优化。利用最佳参数,成功制备出了不同 TSB 浓度的 TSB/PMMA 复合材料,最大 TSB 浓度可达 35 wt%。所制备的复合材料在室温下稳定,光学均匀,在宽光谱范围内透明。合成的 TSB/PMMA 塑料闪烁体的设备相关特性(如折射率、紫外-可见-近红外透射率和光致发光(PL)特性)对其在光学成像应用中的部署非常重要,这些特性作为聚合物基体中 TSB 浓度的函数进行了表征,并对观察到的行为进行了分析。利用 Indus-2 同步辐射设施的 X 射线成像光束线,制作了厚度为 0.5 毫米、具有不同 TSB 浓度的薄晶片,并用于演示分辨率为 100~\mu $ m 的 X 射线成像。此外,还利用特龙贝哈巴原子研究中心(BARC)Dhruva 研究反应堆设施的热中子光束线对两种不同浓度的 5 毫米厚样品进行了中子探测。结果表明,TSB/PMMA 复合材料是一种潜在的塑料闪烁体材料,可用于 X 射线成像和中子闪烁应用。
Development of Trans-Stilbene/PMMA Polymer Composites and Their Optical Characterization for Scintillation-Based Imaging and Detector Applications
Trans-stilbene (TSB) crystals are important for the detection of high-energy photons and neutrons through the process of scintillation. To fulfil the requirement of large area scintillator detector elements, trans-stilbene/poly(methyl methacrylate) (TSB/PMMA) composites have been developed. These plastic scintillator materials can be prepared in a relatively simpler manner as compared to the single crystals. The detailed optimization of the synthesis parameters has been reported. Using the optimal parameters, the TSB/PMMA composites having different TSB concentrations, up to a maximum of 35 wt% TSB, have been successfully fabricated. The fabricated composites were stable at room temperature, optically homogeneous, and transparent in a wide spectral range. The device relevant properties of the synthesized TSB/PMMA plastic scintillator, important for their deployment in optical imaging applications, such as the index of refraction, UV-Vis–NIR transmission, and photoluminescence (PL) properties, have been characterized as a function of TSB concentration in the polymer matrix and the behavior observed has been analyzed. Thin wafers of 0.5 mm thickness having different TSB concentrations were fabricated and used for demonstrating X-ray imaging with a resolution of
$100~\mu $
m, using X-ray imaging beamline of Indus-2 synchrotron radiation facility. In addition, the samples of 5 mm thickness having two different concentrations were used for the detection of neutrons using thermal neutron beamline of Dhruva research reactor facility at Bhabha Atomic Research Centre (BARC), Trombay. The results demonstrate that TSB/PMMA composite is a potential plastic scintillator material for X-ray imaging and neutron scintillation applications.
期刊介绍:
The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years.
The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.