LELAPE: An Open-Source Tool to Classify SEUs According to Their Multiplicity in Radiation-Ground Tests on Memories

This article presents Listas de Eventos Localizando Anomalías al Preparar Estadísticas (LELAPE), an easy-to-use tool that aims at classifying the single-event upsets (SEUs) that were observed in radiation-ground experiments on a memory or a field-programmable gate array (FPGA) into single-bit upsets (SBUs) and multiple-cell upsets (MCUs) with various multiplicities. This tool takes as input one or several datasets obtained in radiation experiments and returns as output the list of events that were identified, without any limitation on the type of device (SRAMs, DRAMs, PSRAMs, FPGAs, and so on) or manufacturing technology (planar, FinFET, and so on). The classification method used consists in analyzing statistical anomalies found in the input dataset(s) that would not be found in a theoretical scenario where only single-bit upsets (SBUs) can occur. It will be proven that the prediction accuracy attained is very high, by using data issued from actual experiments carried out by the authors on several SRAMs under protons and neutrons with various energies. This tool has been made available to the Community through a Zenodo repository and protected by the European Union Public License (EUPL).