{"title":"利用里兹变换对斑点剪切相位和斑点相关相位导数进行相似性研究","authors":"Yassine Tounsi, Manoj Kumar, Karmjit Kaur, Abdelkrim Nassim, Fernando Mendoza-Santoyo, Osamu Matoba","doi":"10.1117/1.oe.63.11.111810","DOIUrl":null,"url":null,"abstract":"Speckle metrology techniques utilize the phenomenon of speckle patterns for various measurement applications. Speckle pattern interferometry and speckle shearography are the widely used speckle metrological techniques in diverse fields. In speckle interferometry, the phase map embedded in the speckle pattern fringes is directly proportional to the displacement; however, in speckle shearography, it is related directly to displacement derivative. We aim to explore the relationship between the extracted phase derivative from speckle fringe pattern and the phase from their corresponding shearing fringes along the x and y directions. A speckle fringe pattern and the sheared fringes along the x and y directions are numerically generated. From speckle fringe pattern, the phase derivatives along the x and y directions are extracted by using the Riesz transform algorithm, whereas from the shearing fringes, the phase distribution is extracted by using monogenic signal. The similarity between the phase derivate distribution from speckle fringe pattern and phase distribution from sheared fringe is quantitatively evaluated by using image quality index. Furthermore, application experimental data are also presented.","PeriodicalId":19561,"journal":{"name":"Optical Engineering","volume":"34 1","pages":""},"PeriodicalIF":1.1000,"publicationDate":"2024-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Similarity study between speckle shearing phase and speckle correlation phase derivative using Riesz transform\",\"authors\":\"Yassine Tounsi, Manoj Kumar, Karmjit Kaur, Abdelkrim Nassim, Fernando Mendoza-Santoyo, Osamu Matoba\",\"doi\":\"10.1117/1.oe.63.11.111810\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Speckle metrology techniques utilize the phenomenon of speckle patterns for various measurement applications. Speckle pattern interferometry and speckle shearography are the widely used speckle metrological techniques in diverse fields. In speckle interferometry, the phase map embedded in the speckle pattern fringes is directly proportional to the displacement; however, in speckle shearography, it is related directly to displacement derivative. We aim to explore the relationship between the extracted phase derivative from speckle fringe pattern and the phase from their corresponding shearing fringes along the x and y directions. A speckle fringe pattern and the sheared fringes along the x and y directions are numerically generated. From speckle fringe pattern, the phase derivatives along the x and y directions are extracted by using the Riesz transform algorithm, whereas from the shearing fringes, the phase distribution is extracted by using monogenic signal. The similarity between the phase derivate distribution from speckle fringe pattern and phase distribution from sheared fringe is quantitatively evaluated by using image quality index. Furthermore, application experimental data are also presented.\",\"PeriodicalId\":19561,\"journal\":{\"name\":\"Optical Engineering\",\"volume\":\"34 1\",\"pages\":\"\"},\"PeriodicalIF\":1.1000,\"publicationDate\":\"2024-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1117/1.oe.63.11.111810\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Engineering","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1117/1.oe.63.11.111810","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
摘要
斑点计量技术利用斑点模式现象进行各种测量应用。斑点图干涉测量法和斑点剪切成像法是广泛应用于各个领域的斑点测量技术。在斑点干涉测量法中,斑点图案条纹中的相位图与位移成正比;而在斑点剪切成像法中,相位图与位移导数直接相关。我们旨在探索从斑点条纹图案中提取的相位导数与沿 x 和 y 方向的相应剪切条纹相位之间的关系。我们用数值方法生成了斑点条纹图案以及沿 x 和 y 方向的剪切条纹。使用里兹变换算法从斑点条纹图案中提取沿 x 和 y 方向的相位导数,而使用单源信号从剪切条纹中提取相位分布。利用图像质量指标定量评估了斑点条纹的相位导数分布与剪切条纹的相位分布之间的相似性。此外,还给出了应用实验数据。
Similarity study between speckle shearing phase and speckle correlation phase derivative using Riesz transform
Speckle metrology techniques utilize the phenomenon of speckle patterns for various measurement applications. Speckle pattern interferometry and speckle shearography are the widely used speckle metrological techniques in diverse fields. In speckle interferometry, the phase map embedded in the speckle pattern fringes is directly proportional to the displacement; however, in speckle shearography, it is related directly to displacement derivative. We aim to explore the relationship between the extracted phase derivative from speckle fringe pattern and the phase from their corresponding shearing fringes along the x and y directions. A speckle fringe pattern and the sheared fringes along the x and y directions are numerically generated. From speckle fringe pattern, the phase derivatives along the x and y directions are extracted by using the Riesz transform algorithm, whereas from the shearing fringes, the phase distribution is extracted by using monogenic signal. The similarity between the phase derivate distribution from speckle fringe pattern and phase distribution from sheared fringe is quantitatively evaluated by using image quality index. Furthermore, application experimental data are also presented.
期刊介绍:
Optical Engineering publishes peer-reviewed papers reporting on research and development in optical science and engineering and the practical applications of known optical science, engineering, and technology.